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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 31 — Nov. 1, 2003
  • pp: 6382–6387

Spectroscopic ellipsometry of metal phthalocyanine thin films

Aleksandra B. Djurišić, Chung Yin Kwong, Tsz Wai Lau, Zheng Tong Liu, Hoi Sing Kwok, Lillian Sze Man Lam, and Wai Kin Chan  »View Author Affiliations


Applied Optics, Vol. 42, Issue 31, pp. 6382-6387 (2003)
http://dx.doi.org/10.1364/AO.42.006382


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Abstract

Optical functions of cobalt phthalocyanine, nickel phthalocyanine (NiPc), and iron phthalocyanine (FePc) have been determined by use of spectroscopic ellipsometry in the spectral range 1.55–4.1 eV (300–800 nm). The samples were prepared by evaporation onto glass and silicon substrates. The optical functions were determined by point-to-point fit. Absorption spectra were also measured. The index-of-refraction data for NiPc and FePc are reported for the first time to our knowledge. Good agreement with the experimental spectra was obtained for all three materials.

© 2003 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.4890) Materials : Organic materials
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: May 22, 2003
Revised Manuscript: July 8, 2003
Published: November 1, 2003

Citation
Aleksandra B. Djurišić, Chung Yin Kwong, Tsz Wai Lau, Zheng Tong Liu, Hoi Sing Kwok, Lillian Sze Man Lam, and Wai Kin Chan, "Spectroscopic ellipsometry of metal phthalocyanine thin films," Appl. Opt. 42, 6382-6387 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-31-6382


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