The characteristics of a few experimental near-field optical microscopes, located in different laboratories, have been compared on the basis of their ability to image a well-defined submicrometer test object.
© 2003 Optical Society of America
Claudine Bainier, Christophe Vannier, Daniel Courjon, Jean-Claude Rivoal, Sébastien Ducourtieux, Yannick De Wilde, Lionel Aigouy, Florian Formanek, Laurent Belliard, Pierre Siry, and Bernard Perrin, "Comparison of test images obtained from various configurations of scanning near-field optical microscopes," Appl. Opt. 42, 691-700 (2003)