OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 4 — Feb. 1, 2003
  • pp: 691–700

Comparison of test images obtained from various configurations of scanning near-field optical microscopes

Claudine Bainier, Christophe Vannier, Daniel Courjon, Jean-Claude Rivoal, Sébastien Ducourtieux, Yannick De Wilde, Lionel Aigouy, Florian Formanek, Laurent Belliard, Pierre Siry, and Bernard Perrin  »View Author Affiliations


Applied Optics, Vol. 42, Issue 4, pp. 691-700 (2003)
http://dx.doi.org/10.1364/AO.42.000691


View Full Text Article

Enhanced HTML    Acrobat PDF (1328 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The characteristics of a few experimental near-field optical microscopes, located in different laboratories, have been compared on the basis of their ability to image a well-defined submicrometer test object.

© 2003 Optical Society of America

OCIS Codes
(110.2960) Imaging systems : Image analysis
(180.5810) Microscopy : Scanning microscopy
(220.4840) Optical design and fabrication : Testing
(350.3950) Other areas of optics : Micro-optics

History
Original Manuscript: April 4, 2002
Revised Manuscript: October 3, 2002
Published: February 1, 2003

Citation
Claudine Bainier, Christophe Vannier, Daniel Courjon, Jean-Claude Rivoal, Sébastien Ducourtieux, Yannick De Wilde, Lionel Aigouy, Florian Formanek, Laurent Belliard, Pierre Siry, and Bernard Perrin, "Comparison of test images obtained from various configurations of scanning near-field optical microscopes," Appl. Opt. 42, 691-700 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-4-691


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. M. Ohtsu, H. Hori, “Basic principles to nano-fabrication and nano-photonics,” in Near-Field Nano-Optics (Kluwer Academic/Plenum, New York, 1999). [CrossRef]
  2. D. Courjon, C. Bainier, “Near field microscopy and near field optics,” Rep. Prog. Phys. 57, 989–1028 (1994). [CrossRef]
  3. R. Micheletto, H. Fukuda, M. Ohtsu, “A simple method for the production of a two-dimensional ordered array of small latex particles,” Langmuir 11, 44–47 (1995). [CrossRef]
  4. J. Salvi, D. Courjon, “Resonant optical cavity used as a nonradiating source for optical near-field microscopy,” Opt. Lett. 24, 1811–1813 (1999). [CrossRef]
  5. J. Salvi, “Mise en oeuvre d’un résonateur optique’ en microscopie en champ proche afin d’augmenter les résolutions latérales et le rapport signal sur bruit,” Ph.D. thesis (Université de Franche-Comté, Besançon, France, 2000).
  6. C. Vannier, C. Bainier, D. Courjon, “Isotropic incoherent scanning tunneling optical microscope (I2 STOM),” Optics Commun. 175, 83–88 (2000). [CrossRef]
  7. C. Thiébaud, “Apport de l’inspection haute résolution à l’étude de matériaux ferroélectriques en couches minces. Activité électro-optique champ lointain d’un fluide électrorhéologique,” Ph.D. thesis (Université de Franche-Comté, Besançon, France, 2001).
  8. Y. Martin, F. Zenhausern, H. K. Wickramasinghe, “Scattering spectroscopy of molecules at nanometer resolution,” Appl. Phys. Lett. 68, 2475–2477 (1996). [CrossRef]
  9. S. Grésillon, S. Ducourtieux, A. Lahrech, L. Aigouy, J. C. Rivoal, A. C. Boccara, “Nanometer scale apertureless near field microscopy,” Appl. Surf. Sci. 164, 118–123 (2000). [CrossRef]
  10. L. Aigouy, A. Lahrech, S. Grésillon, H. Cory, A.-C. Boccara, J. C. Rivoal, “Polarization effects in apertureless scanning near-field optical microscopy: an experimental study,” Opt. Lett. 24, 187–189 (1999). [CrossRef]
  11. O. J. F. Martin, Ch. Girard, “Controlling and tuning strong optical field gradients at the local probe microscope tip apex,” Appl. Phys. Lett. 70, 705–707 (1997). [CrossRef]
  12. L. Novotny, X. Bian, X. S. Xie, “Theory of nanometric tweezers,” Phys. Rev. Lett. 79, 645–648 (1997). [CrossRef]
  13. S. Ducourtieux, S. Grésillon, J. C. Rivoal, H. Cory, “Imaging subwavelength holes in chromium films with apertureless SNOM. Comparison between experiment and calculations,” submitted to Eur. Phys. J. Appl. Phys.
  14. S. Ducourtieux, “Microscopie optique en champ proche sans ouverture: développement d’un instrument et application à l’étude de nanostructures,” Ph.D. thesis (Université de Paris 6, Paris, France, 2001).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited