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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 6 — Feb. 20, 2004
  • pp: 1349–1354

Illumination Compensation Methods for Automatic Fiber Connector Inspection

Yaguang Yang  »View Author Affiliations


Applied Optics, Vol. 43, Issue 6, pp. 1349-1354 (2004)
http://dx.doi.org/10.1364/AO.43.001349


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Abstract

Unevenly distributed image illumination is a problem in an automatic machine visual inspection system used for fiber connector defect detection. This unevenly distributed illumination makes it difficult to find an appropriate horizontal threshold to convert a gray-scale image to a binary image to separate surface defects, such as blobs and scratches, from the background of the connector. This paper proposes some effective methods to compensate the unevenly distributed illumination problem so that standard image processing methods can be used effectively to detect the defects of the fiber connectors.

© 2004 Optical Society of America

OCIS Codes
(100.2000) Image processing : Digital image processing
(150.3040) Machine vision : Industrial inspection

Citation
Yaguang Yang, "Illumination Compensation Methods for Automatic Fiber Connector Inspection," Appl. Opt. 43, 1349-1354 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-6-1349


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References

  1. Users’ Manual of ZX-1 Micro Connector Inspection Interferometer (Speer Fiber Optics, Hillsborough, N.J., 2000).
  2. R. T. Chin, “Automatic visual Inspection: 1981–1987,” Comput. Vision Graph. Image Process. 41, 346–381(1998).
  3. T. S. Newman and A. K. Jain, “A survey of automatic visual inspection,” Comput. Vision Image Understand. 61, 231–262(1995).
  4. B. E. Dom and V. Brecher, “Recent advances in the automatic inspection of integrated circuits for pattern defects,” Mach. Vision Appl. 8, 5–19(1995).
  5. B. K. P. Horn, Robot Vision (MIT Press, Cambridge, Mass., 1986), p. 187.
  6. B. K. P. Horn, “Image intensity understanding,” Artif. Intell. 8, 201–231(1977).
  7. P. Moon, The Scientific Basis of Illumination Engineering (Dover, New York, 1961).
  8. S. Weisberg, Applied Linear Regression, 2nd ed.(Wiley, New York, 1985)
  9. M. Jiang, “Digital image processing,” http://ct.radiology.uiowa.edu/~jiangm/courses/dip/html/dip.html.
  10. International Electrotechnical Commission, Cables, Wires, Waveguides, RF Connectors, and Accessories, Communication and Signaling, IEC Standard TC46 (International Technical Commission, Geneva, Switzerland, 2003).

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