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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 10 — Apr. 1, 2005
  • pp: 1785–1791

Improved interferometric detection of scattered light with a 4f imaging system

John W. Pyhtila and Adam Wax  »View Author Affiliations


Applied Optics, Vol. 44, Issue 10, pp. 1785-1791 (2005)
http://dx.doi.org/10.1364/AO.44.001785


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Abstract

We analyze the performance of three imaging systems to detect near-forward scattered light interferometrically by using a Mach-Zehnder geometry. The alignment of each system is demonstrated by measurement of the heterodyne efficiency and correlation of the angular width and field 1/e radius measurements of the sample beam. Measurements of angular-scattering data demonstrate the range of angles over which each system is effective. Of the three systems analyzed, the 4f imaging system is determined to be most effective, because it accurately reproduces both the phase and the amplitude of the scattered field at the detector.

© 2005 Optical Society of America

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(290.0290) Scattering : Scattering

Citation
John W. Pyhtila and Adam Wax, "Improved interferometric detection of scattered light with a 4f imaging system," Appl. Opt. 44, 1785-1791 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-10-1785


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