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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 24 — Aug. 22, 2005
  • pp: 5046–5054

Optical design of a high-spatial-resolution extreme-ultraviolet spectroheliograph for the transition region

Giampiero Naletto, Silvano Fineschi, Ester Antonucci, Vania Da Deppo, Piergiorgio Nicolosi, Luca Zangrilli, Marco Romoli, Marco Malvezzi, and Daniel Moses  »View Author Affiliations


Applied Optics, Vol. 44, Issue 24, pp. 5046-5054 (2005)
http://dx.doi.org/10.1364/AO.44.005046


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Abstract

A spectroheliograph dedicated to the observation of the solar disk in the extreme-ultraviolet OV spectral line at 62.97 nm is described. As demonstrated in the Skylab SO-82A spectroheliograph [Appl. Opt. 16, 870 (1977)], this line is uniquely suited to characterize solar plasma in the important 250,000 K temperature regime. No multilayer coating or suitable filter is yet available to select this wavelength, so an optical design based on a double spectrograph with a spatial filter to remove the unwanted radiation has been developed. Analysis of the optical design shows that this instrument can obtain a 1 arcsec spatial resolution (two pixels) with a relatively high image-acquisition cadence. A preliminary tolerance analysis has been performed. A simple method of instrument alignment in visible light is also described.

© 2005 Optical Society of America

OCIS Codes
(110.6770) Imaging systems : Telescopes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(220.4830) Optical design and fabrication : Systems design
(260.7200) Physical optics : Ultraviolet, extreme
(350.1260) Other areas of optics : Astronomical optics
(350.6090) Other areas of optics : Space optics

Citation
Giampiero Naletto, Silvano Fineschi, Ester Antonucci, Vania Da Deppo, Piergiorgio Nicolosi, Luca Zangrilli, Marco Romoli, Marco Malvezzi, and Daniel Moses, "Optical design of a high-spatial-resolution extreme-ultraviolet spectroheliograph for the transition region," Appl. Opt. 44, 5046-5054 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-24-5046

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