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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 35 — Dec. 10, 2005
  • pp: 7515–7521

Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry

Dalip Singh Mehta, Satish Kumar Dubey, M. Mosarraf Hossain, and Chandra Shakher  »View Author Affiliations


Applied Optics, Vol. 44, Issue 35, pp. 7515-7521 (2005)
http://dx.doi.org/10.1364/AO.44.007515


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Abstract

We propose a simple multifrequency spatial-carrier and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry (LSI). In this system a wedge-shaped plate lateral shearing interferometer is used and, owing to the presence of tilt, a finite number of fringes parallel to the direction of the shear appears; hence a significant spatial-carrier frequency is generated at the focus position. We further enhance the spatial-carrier frequency either by changing the wavelength of the laser light or by slight defocusing. A synthetic interferogram with low spatial-carrier frequency is obtained by use of laser light of two wavelengths simultaneously in the lateral shear interferometer. We obtain the phase-shifted fringe patterns from the same setup by simply moving the wedge plate in an in-plane parallel direction, using a linear translator. The fringe projection system was tested for measurement of the three-dimensional shape of a discontinuous object. The present system has many advantages; e.g., it is a common-path interferometry and hence is insensitive to external vibrations, is compact in size, and is relatively inexpensive.

© 2005 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

ToC Category:
Interferometry

History
Original Manuscript: May 6, 2005
Manuscript Accepted: July 8, 2005
Published: December 10, 2005

Citation
Dalip Singh Mehta, Satish Kumar Dubey, M. Mosarraf Hossain, and Chandra Shakher, "Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry," Appl. Opt. 44, 7515-7521 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-35-7515

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