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Applied Optics

Applied Optics


  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 35 — Dec. 10, 2005
  • pp: 7515–7521

Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry

Dalip Singh Mehta, Satish Kumar Dubey, M. Mosarraf Hossain, and Chandra Shakher  »View Author Affiliations

Applied Optics, Vol. 44, Issue 35, pp. 7515-7521 (2005)

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We propose a simple multifrequency spatial-carrier and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry (LSI). In this system a wedge-shaped plate lateral shearing interferometer is used and, owing to the presence of tilt, a finite number of fringes parallel to the direction of the shear appears; hence a significant spatial-carrier frequency is generated at the focus position. We further enhance the spatial-carrier frequency either by changing the wavelength of the laser light or by slight defocusing. A synthetic interferogram with low spatial-carrier frequency is obtained by use of laser light of two wavelengths simultaneously in the lateral shear interferometer. We obtain the phase-shifted fringe patterns from the same setup by simply moving the wedge plate in an in-plane parallel direction, using a linear translator. The fringe projection system was tested for measurement of the three-dimensional shape of a discontinuous object. The present system has many advantages; e.g., it is a common-path interferometry and hence is insensitive to external vibrations, is compact in size, and is relatively inexpensive.

© 2005 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

ToC Category:

Original Manuscript: May 6, 2005
Manuscript Accepted: July 8, 2005
Published: December 10, 2005

Dalip Singh Mehta, Satish Kumar Dubey, M. Mosarraf Hossain, and Chandra Shakher, "Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry," Appl. Opt. 44, 7515-7521 (2005)

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  1. F. Chen, G. M. Brown, M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10–22 (2000). [CrossRef]
  2. H. J. Tiziani, “Optical metrology of engineering surfaces-scope and trends,” in Optical Measurement Techniques and Applications, P. K. Rastogi, ed. (Artech House, 1997).
  3. M. Lehmann, P. Jacquot, M. Facchini, “Shape measurement of large surfaces by fringe projection,” Exp. Tech. 23, 31–35 (1999). [CrossRef]
  4. K. Korner, R. Windecker, M. Fleischer, H. J. Tiziani, “One-grating projection for absolute three-dimensional profiling,” Opt. Eng. 40, 1653–1660 (2001). [CrossRef]
  5. J. A. Jalkio, R. C. Kim, S. K. Case, “Three-dimensional inspection using multi-stripe structured light,” Opt. Eng. 24, 966–974 (1985). [CrossRef]
  6. Y. B. Choi, S. W. Kim, “Phase-shifting grating projection moiré topography,” Opt. Eng. 37, 1005–1010 (1998). [CrossRef]
  7. V. Srinivasan, H. C. Liu, M. Halioua, “Automated phase measuring profilometry of a 3-D diffuse object,” Appl. Opt. 23, 3105–3108 (1984). [CrossRef]
  8. M. Takeda, H. Ina, S. Kobayashi, “Fourier-transform method of fringe pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. 72, 156–160 (1982). [CrossRef]
  9. X. Su, W. Chen, “Fourier transform profilometry: a review,” Opt. Lasers Eng. 35, 263–284 (2001). [CrossRef]
  10. S. Yoneyana, Y. Morimoto, M. Fujigaki, Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137–142 (2003). [CrossRef]
  11. C. Quan, X. Y. He, C. F. Wang, C. J. Tay, H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21–29 (2001). [CrossRef]
  12. C. Quan, C. J. Tay, X. Kang, X. Y. He, H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329–2335 (2003). [CrossRef] [PubMed]
  13. P. S. Huang, C. Zhang, F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163–168 (2003). [CrossRef]
  14. J.-L. Li, H.-J. Su, X.-Y. Su, “Two-frequency grating used in phase-measuring profilometry,” Appl. Opt. 36, 277–280 (1997). [CrossRef] [PubMed]
  15. R. Windecker, M. Fliescher, H. J. Tiziani, “Three-dimensional topometry with stereo microscopes,” Opt. Eng. 36, 3372–3376 (1997). [CrossRef]
  16. J. Zhong, Y. Zhang, “Absolute phase-measurement technique based on number theory in multifrequency grating projection profilometry,” Appl. Opt. 40, 492–500 (2001). [CrossRef]
  17. D. Malacara, ed., Optical Shop Testing, 2nd ed. (Wiley, 1992).
  18. R. S. Kasana, K. J. Rosenbruch, “Determination of the refractive index of a lens using the Murty shearing interferometer,” Appl. Opt. 22, 3526–3531 (1983). [CrossRef] [PubMed]
  19. T. Nomura, K. Kamiya, H. Miyashiro, S. Okuda, H. Tashiro, K. Yoshikawa, “Shape measurements of mirror surfaces with lateral-shearing interferometer during machine running,” Precis. Eng. 22, 185–189 (1998). [CrossRef]
  20. C. Shakher, S. Prakash, “Monitoring/measurement of vibrations using shearing interferometry and interfermetric grating,” Opt. Lasers Eng. 38, 269–277 (2002). [CrossRef]
  21. P. Singh, C. Shakher, “Measurement of the temperature of a gaseous flame using a shearing plate,” Opt. Eng. 42, 80–85 (2003). [CrossRef]
  22. P. Singh, M. S. Faridi, C. Shakher, “Measurement of temperature of an axisymmetric flame using shearing interferometry and Fourier fringe analysis technique,” Opt. Eng. 43, 387–392 (2004). [CrossRef]
  23. D. W. Griffin, “Phase-shifting shearing interferometer,” Opt. Lett. 26, 140–141 (2001). [CrossRef]
  24. J. B. Song, Y. W. Lee, I. W. Lee, Y.-H. Lee, “Simple phase-shifting method in a wedge-plate lateral-shearing interferometer,” Appl. Opt. 43, 3989–3992 (2004). [CrossRef] [PubMed]
  25. H.-H. Lee, J.-H. You, S.-H. Park, “Phase-shifting lateral shearing interferometer with two pairs of wedge plates,” Opt. Lett. 28, 2243–2245 (2003). [CrossRef] [PubMed]
  26. E. Mihaylova, M. Whelan, V. Toal, “Simple phase shifting lateral shearing interferometer,” Opt. Lett. 29, 1264–1266 (2004). [CrossRef] [PubMed]
  27. J. C. Wyant, “Testing aspherics using two-wavelength holography,” Appl. Opt. 10, 2113–2118 (1971). [CrossRef] [PubMed]
  28. C. Polhemus, “Two-wavelength interferometry,” Appl. Opt. 12, 2071–2074 (1973). [CrossRef] [PubMed]
  29. Y. Y. Cheng, J. C. Wyant, “Two-wavelength phase shifting interferometry,” Appl. Opt. 23, 4539–4543 (1984). [CrossRef] [PubMed]
  30. G. Margheri, C. Giunti, S. Manhart, R. Maurer, “Double wavelength superheterodyne interferometer for absolute ranging with submillimeter resolution: results obtained with a demonstration model by use of rough and reflective targets,” Appl. Opt. 36, 6211–6216 (1997). [CrossRef]
  31. C. C. Williams, H. K. Wickramasinghe, “Absolute optical ranging with 200-nm resolution,” Opt. Lett. 14, 542–544 (1989). [CrossRef] [PubMed]
  32. H. Matsumoto, “Length measurement using infrared two-wavelength He–Xe laser interferferometer,” Rev. Sci. Instrum. 53, 641–643 (1982). [CrossRef]
  33. R. Dandliker, K. Hug, J. Politch, E. Zimmermann, “High-accuracy distance measurements with multiple-wavelength interferometry,” Opt. Eng. 34, 2407–2412 (1995). [CrossRef]
  34. G. L. Bourdet, A. G. Orszag, “Absolute distance measurement by CO2 laser multiwavelength interferometry,” Appl. Opt. 18, 225–227 (1979). [CrossRef] [PubMed]
  35. P. de Groot, “Unusual techniques for absolute distance measurement,” Opt. Eng. 40, 28–32 (2001). [CrossRef]
  36. H. Kikuta, K. Iwata, R. Nagata, “Distance measurement by the wavelength shift of laser diode light,” Appl. Opt. 25, 2976–2980 (1986). [CrossRef] [PubMed]
  37. Y. Ishii, R. Onodera, “Two-wavelength laser diode interferometry that uses phase-shifting techniques,” Opt. Lett. 16, 1523–1525 (1991). [CrossRef] [PubMed]
  38. D. S. Mehta, P. Singh, M. S. Faridi, S. Mirza, C. Shakher, “Two-wavelength lateral shearing interferometry,” Opt. Eng. 44, 85,603–85,609 (2005). [CrossRef]
  39. D. S. Mehta, P. Singh, M. S. Faridi, S. Mirza, C. Shakher, “Distance measurement with extended range using lateral shearing interferometry and Fourier transform fringe analysis,” Opt. Eng. 44, 63,602–63,611 (2005). [CrossRef]

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