Theoretical investigation of the off-axis z-scan technique for nonlinear optical refraction measurement
Applied Optics, Vol. 45, Issue 12, pp. 2773-2776 (2006)
http://dx.doi.org/10.1364/AO.45.002773
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Abstract
The theoretical investigation of the off-axis z-scan technique for the measurement of nonlinear optical refraction in materials is presented. The normalized transmittance is calculated for different aperture radii and positions. The dependence of both the normalized transmittance amplitude
© 2006 Optical Society of America
OCIS Codes
(160.4330) Materials : Nonlinear optical materials
(190.4180) Nonlinear optics : Multiphoton processes
(190.4360) Nonlinear optics : Nonlinear optics, devices
(190.4400) Nonlinear optics : Nonlinear optics, materials
History
Original Manuscript: September 9, 2005
Revised Manuscript: November 24, 2005
Manuscript Accepted: November 26, 2005
Citation
Aleksandr I. Ryasnyansky and Bruno Palpant, "Theoretical investigation of the off-axis z-scan technique for nonlinear optical refraction measurement," Appl. Opt. 45, 2773-2776 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-12-2773
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