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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 23 — Aug. 10, 2006
  • pp: 5910–5922

Global optimization and modeling techniques for planar multilayered dielectric structures

R. F. Oulton and C. S. Adjiman  »View Author Affiliations


Applied Optics, Vol. 45, Issue 23, pp. 5910-5922 (2006)
http://dx.doi.org/10.1364/AO.45.005910


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Abstract

We present a multilevel global optimization strategy for synthesizing planar multilayered dielectric structures. A low discrepancy sequence of sample points with uniform variable space coverage allows a global-level search while systematic refinement using gradient-based techniques identifies optima at the local level. Since efficient local optimization is important for this method, a fast calculation approach based on mode matching is presented; this also facilitates the compact derivation of analytical gradients. The approach is compared with genetic and simulated annealing algorithms through an antireflection coating design. The method proves to be competitive in terms of its performance, nonadaptive algorithm, and ability to track local solutions.

© 2006 Optical Society of America

OCIS Codes
(230.4170) Optical devices : Multilayers
(310.0310) Thin films : Thin films

History
Original Manuscript: December 15, 2005
Revised Manuscript: February 13, 2006
Manuscript Accepted: March 6, 2006

Citation
R. F. Oulton and C. S. Adjiman, "Global optimization and modeling techniques for planar multilayered dielectric structures," Appl. Opt. 45, 5910-5922 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-23-5910

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