Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis
Applied Optics, Vol. 45, Issue 23, pp. 6038-6044 (2006)
http://dx.doi.org/10.1364/AO.45.006038
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Abstract
Surface plasmon resonance (SPR) sensing and an enhanced data analysis technique are used to obtain precise predictions of the dielectric constant and thickness of a nanolayer. In the proposed approach, a modified analytical method is used to obtain initial estimates of the dielectric constants and thicknesses of the metal film and a nanolayer on the sensing surface of a SPR sensor. A multiexperiment data analysis approach based on a two-solvent SPR method is then employed to improve the initial estimates by suppressing the noise in the measurement data. The proposed two-stage approach is employed to determine the dielectric constant and thickness of a molecular imprinting polymer nanolayer. It is found that the results are in good agreement with those obtained with an ellipsometer and a high-resolution scanning electron microscope.
© 2006 Optical Society of America
OCIS Codes
(240.6680) Optics at surfaces : Surface plasmons
(260.3910) Physical optics : Metal optics
History
Original Manuscript: April 12, 2006
Revised Manuscript: May 12, 2006
Manuscript Accepted: May 12, 2006
Virtual Issues
Vol. 1, Iss. 9 Virtual Journal for Biomedical Optics
Citation
Jin-Jung Chyou, Chih-Sheng Chu, Fan-Ching Chien, Chun-Yu Lin, Tse-Liang Yeh, Roy Chaoming Hsu, and Shean-Jen Chen, "Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis," Appl. Opt. 45, 6038-6044 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-23-6038
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