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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 27 — Sep. 20, 2006
  • pp: 7056–7064

4Pi microscopy deconvolution with a variable point-spread function

David Baddeley, Christian Carl, and Christoph Cremer  »View Author Affiliations


Applied Optics, Vol. 45, Issue 27, pp. 7056-7064 (2006)
http://dx.doi.org/10.1364/AO.45.007056


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Abstract

To remove the axial sidelobes from 4Pi images, deconvolution forms an integral part of 4Pi microscopy. As a result of its high axial resolution, the 4Pi point spread function (PSF) is particularly susceptible to imperfect optical conditions within the sample. This is typically observed as a shift in the position of the maxima under the PSF envelope. A significantly varying phase shift renders deconvolution procedures based on a spatially invariant PSF essentially useless. We present a technique for computing the forward transformation in the case of a varying phase at a computational expense of the same order of magnitude as that of the shift invariant case, a method for the estimation of PSF phase from an acquired image, and a deconvolution procedure built on these techniques.

© 2006 Optical Society of America

OCIS Codes
(100.1830) Image processing : Deconvolution
(100.3190) Image processing : Inverse problems
(180.1790) Microscopy : Confocal microscopy
(180.2520) Microscopy : Fluorescence microscopy

History
Original Manuscript: December 21, 2005
Manuscript Accepted: March 14, 2006

Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics

Citation
David Baddeley, Christian Carl, and Christoph Cremer, "4Pi microscopy deconvolution with a variable point-spread function," Appl. Opt. 45, 7056-7064 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-27-7056

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