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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 34 — Dec. 1, 2006
  • pp: 8606–8612

Quasi-absolute measurement of aspheres with a combined diffractive optical element as reference

Frank Simon, Gufran Khan, Klaus Mantel, Norbert Lindlein, and Johannes Schwider  »View Author Affiliations

Applied Optics, Vol. 45, Issue 34, pp. 8606-8612 (2006)

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We have already reported a method for the quasi-absolute test of rotationally symmetric aspheres by means of combined diffractive optical elements (combo-DOEs). The combo-DOEs carry the information for the ideal shape of an aspheric surface under test as well as a spherical wave for the measurement at the cat's eye position. An experimental demonstration of the procedure is given. Measurements with two different designs of combo-DOEs have been conducted, and their relative advantages and disadvantages are discussed.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(220.4840) Optical design and fabrication : Testing

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: April 3, 2006
Revised Manuscript: July 6, 2006
Manuscript Accepted: July 6, 2006

Frank Simon, Gufran Khan, Klaus Mantel, Norbert Lindlein, and Johannes Schwider, "Quasi-absolute measurement of aspheres with a combined diffractive optical element as reference," Appl. Opt. 45, 8606-8612 (2006)

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  1. M. Bosse and T. Blümel, "Interferometric asphere testing without CGH," in Proceedings of the Deutsche Gesellschaft für Angewandte Optik 2004, http://www.dgao-proceedings.de/download/105/105_p47.pdf.
  2. M. Schulz, P. Thomsen-Schmidt, and I. Weingärtner, "Reliable curvature sensor for measuring the topography of complex surfaces," in Optical Devices and Diagnostics in Materials Science, D. L. Andrews, T. Asakura, S. Jutamulia, W. P. Kirk, M. G. Lagally, R. B. Lal, and J. D. Trolinger, eds., Proc. SPIE 4098, 84-93 (2000).
  3. A. J. MacGovern and J. C. Wyant, "Computer generated holograms for testing optical elements," Appl. Opt. 10, 619-624 (1971). [CrossRef] [PubMed]
  4. G. Schulz and J. Schwider, "Interferometric testing of smooth surfaces," in Progress in Optics , E. Wolf, ed. (Elsevier North-Holland, 1976), Vol. 13, p. 93. [CrossRef]
  5. M. BeyerleinN. Lindlein, and J. Schwider, "Dual-wave-front computer-generated holograms for quasi-absolute testing of aspherics," Appl. Opt. 41, 2440-2447 (2002). [CrossRef] [PubMed]
  6. J. Schwider, "Absolutprüfung von asphärischen Flächen unter Zuhilfenahme von diffraktiven Normalelementen und planen sowie sphärischen Referenzflächen," German patent 19822453.2 (20 June 1998).
  7. J. Schwider, "Interferometric tests for aspherics," in Fabrication and Testing of Aspheres, J. S. Taylor, M. Piscotty and A. Lindquist, eds., Vol. 24 of Trends in Optics and Photonics Series (Optical Society of America, 1999), pp. 103-114.
  8. N. Lindlein, "Analysis of the disturbing diffraction orders of computer-generated holograms used for testing optical aspherics," Appl. Opt. 40, 2698-2708 (2001). [CrossRef]
  9. J. B. Houston, Jr., C. J. Buccini, and P. K. O'Neill, "A laser unequal path interferometer for the optical shop," Appl. Opt. 6, 1237-1242 (1967). [CrossRef] [PubMed]
  10. S. M. Arnold, "How to test an asphere with a computer generated hologram," in Holographic Optics: Optically and Computer Generated, I Cindrich and S. H. Lee, eds., Proc. SPIE 1052, 191-197 (1989).
  11. M. P. Rimmer, "Analysis of perturbed lens systems," Appl. Opt. 9, 533-537 (1970). [CrossRef] [PubMed]
  12. E. W. Young, "Optimal removal of all mislocation effects in interferometric tests, in Optical Testing and Metrology, C. P. Grover, ed., Proc. SPIE 661, 116-124 (1986).
  13. http://www.optik.uni-erlangen.de/odem/research/work/index.php?what=ray.
  14. J. Schwider, R. Burow, K.-E. Elssner, J. Grzanna, R. Spolaczyk, and K. Merkel, "Digital wave-front measuring interferometry: some systematic error sources," Appl. Opt. 22, 3421-3432 (1983). [CrossRef] [PubMed]

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