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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 1 — Jan. 1, 2007
  • pp: 9–17

Principal components analysis of the photoresponse nonuniformity of a matrix detector

Alejandro Ferrero, Javier Alda, Joaquín Campos, Jose Manuel López-Alonso, and Alicia Pons  »View Author Affiliations

Applied Optics, Vol. 46, Issue 1, pp. 9-17 (2007)

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The principal component analysis is used to identify and quantify spatial distributions of relative photoresponse as a function of the exposure time for a visible CCD array. The analysis shows a simple way to define an invariant photoresponse nonuniformity and compare it with the definition of this invariant pattern as the one obtained for long exposure times. Experimental data of radiant exposure from levels of irradiance obtained in a stable and well-controlled environment are used.

© 2007 Optical Society of America

OCIS Codes
(040.1520) Detectors : CCD, charge-coupled device
(120.5630) Instrumentation, measurement, and metrology : Radiometry

ToC Category:

Original Manuscript: May 22, 2006
Revised Manuscript: September 6, 2006
Manuscript Accepted: September 8, 2006

Alejandro Ferrero, Javier Alda, Joaquín Campos, Jose Manuel López-Alonso, and Alicia Pons, "Principal components analysis of the photoresponse nonuniformity of a matrix detector," Appl. Opt. 46, 9-17 (2007)

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