OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 14 — May. 10, 2007
  • pp: 2615–2623

Geometrical considerations in analyzing isotropic or anisotropic surface reflections

Lionel Simonot and Gael Obein  »View Author Affiliations


Applied Optics, Vol. 46, Issue 14, pp. 2615-2623 (2007)
http://dx.doi.org/10.1364/AO.46.002615


View Full Text Article

Enhanced HTML    Acrobat PDF (2109 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The bidirectional reflectance distribution function (BRDF) represents the evolution of the reflectance with the directions of incidence and observation. Today BRDF measurements are increasingly applied and have become important to the study of the appearance of surfaces. The representation and the analysis of BRDF data are discussed, and the distortions caused by the traditional representation of the BRDF in a Fourier plane are pointed out and illustrated for two theoretical cases: an isotropic surface and a brushed surface. These considerations will help characterize either the specular peak width of an isotropic rough surface or the main directions of the light scattered by an anisotropic rough surface without misinterpretations. Finally, what is believed to be a new space is suggested for the representation of the BRDF, which avoids the geometrical deformations and in numerous cases is more convenient for BRDF analysis.

© 2007 Optical Society of America

OCIS Codes
(080.2720) Geometric optics : Mathematical methods (general)
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(240.5770) Optics at surfaces : Roughness

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 13, 2006
Revised Manuscript: December 22, 2006
Manuscript Accepted: December 26, 2006
Published: April 23, 2007

Citation
Lionel Simonot and Gael Obein, "Geometrical considerations in analyzing isotropic or anisotropic surface reflections," Appl. Opt. 46, 2615-2623 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-14-2615


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. A. da Silva, C. Andraud, E. Charron, B. Stout, and J. Lafait, "Multiple light scattering in multilayered media: theory, experiments," Physica B 338, 74-78 (2003). [CrossRef]
  2. M. Nadal and T. A. Germer, "Colorimetric characterization of pearlescent coatings," Proc. SPIE 4421, 757-760 (2001). [CrossRef]
  3. Q. Z. Zhu and Z. M. Zhang, "Anisotropic slope distribution and bidirectional reflectance of a rough silicon surface," J. Heat Transfer 126, 985-993 (2004). [CrossRef]
  4. Vocabulaire International de la CIE, definition 845-04-70, 4th ed., publication CIE No. 50 (845), Bureau Central de la CIE (Paris, 1987).
  5. G. Obein, R. Bousquet, and M. E. Nadal, "New NIST reference goniospectrometer," Proc. SPIE 5880, 241-250 (2005).
  6. D. Hünerhoff, U. Grusemann, and A. Höpe, "New robot-based gonioreflectometer for measuring spectral diffuse reflection," Metrologia 43, S11-S16 (2006). [CrossRef]
  7. A. da Silva, M. Elias, C. Andraud, and J. Lafait, "Comparison between the auxiliary function method and the discrete-ordinate method for solving the radiative transfer equation for light scattering," J. Opt. Soc. Am. A 20, 2321-2329 (2003). [CrossRef]
  8. G. Meister, A. Rothkirch, H. Spitzer, and J. Bienlein, "Width of the specular peak perpendicular to the principal plane for rough surfaces", Appl. Opt. 40, 6072-6080 (2001). [CrossRef]
  9. R. Seve, "Problems connected with the concept of gloss," Color Res. Appl. 18, 241-252 (1993). [CrossRef]
  10. S. M. Rusinkiewicz, "New change of variables foe efficient BRDF representation," in Eurographics Rendering Workshop '98 (1998), pp. 11-22.
  11. K. E. Torrance and E. M. Sparrow, "Theory for off-specular reflection from roughened surfaces," J. Opt. Soc. Am. 9, 1105-1114 (1967). [CrossRef]
  12. J. Blinn, "Models of light reflection for computer synthesized pictures," in Proceedings of SIGGRAPH'77 (1977), Vol. 11, 192-198.
  13. R. L. Cook and K. E. Torrance, "A reflectance model for computer graphics," in Proceedings of SIGGRAPH'81 (1981), Vol. 15, pp. 301-316.
  14. P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Pergamon, 1963), pp. 70-98.
  15. G. Ward, "Measuring and modelling anisotropic reflection," in Proceedings of SIGGRAPH'92 (1992), Vol. 26, pp. 265-272.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited