OSA's Digital Library

Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 15 — May. 20, 2007
  • pp: 2851–2858

Uncertainty evaluation for the spectroradiometric measurement of the averaged light-emitting diode intensity

Seongchong Park, Dong-Hoon Lee, Yong-Wan Kim, and Seung-Nam Park  »View Author Affiliations

Applied Optics, Vol. 46, Issue 15, pp. 2851-2858 (2007)

View Full Text Article

Enhanced HTML    Acrobat PDF (1550 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



An uncertainty evaluation is presented for the spectroradiometric measurement of the averaged LED intensity (ALI), which is a standardized photometric quantity of LEDs introduced by the Commission Internationale de l'Éclairage. Using a spectral irradiance standard lamp as a calibration source for the spectroradiometer, 12 uncertainty components are sorted out and their propagation formulated with correlations between the components taken into account. The procedure of uncertainty evaluation is demonstrated for four LED samples of different colors; red, green, blue, and white. The relative uncertainties of the ALI of the test samples are determined to be in a range from 4.1% to 5.5% ( k = 2 ) , but most of their dominant uncertainty components turn out to be systematic and correlated. In conclusion, correlations between the uncertainty components critically affect the overall uncertainty of the LED measurement using a spectroradiometer.

© 2007 Optical Society of America

OCIS Codes
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.5240) Instrumentation, measurement, and metrology : Photometry
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 6, 2006
Manuscript Accepted: November 21, 2006
Published: May 1, 2007

Seongchong Park, Dong-Hoon Lee, Yong-Wan Kim, and Seung-Nam Park, "Uncertainty evaluation for the spectroradiometric measurement of the averaged light-emitting diode intensity," Appl. Opt. 46, 2851-2858 (2007)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. D. G. Pelka and K. Patel, "An overview of LED applications for general illumination," in Design of Efficient Illumination Systems, R. John Koshel, ed., Proc. SPIE 5186, 15-26 (2003). [CrossRef]
  2. E. F. Schubert, Light-Emitting Diodes(Cambridge U. Press, 2003), pp. 84-98.
  3. Commision Internationale de l'Éclairage, Measurement of LEDs, CIE publication 127 (CIE, 1999).
  4. Commision Internationale de l'Éclairage, Method of characterizing illuminance meters and luminance meters, CIE Publication 69 (CIE, 1987).
  5. J. L. Gardner, Uncertainties in Photometric Integrals [NMI TR 9] (Commonwealth of Australia, 2005), http://www.measurement.gov.au.
  6. J. H. Walker, R. D. Saunders, J. K. Jackson, and D. A. McSparron, NBS Measurement Service: Spectral Irradiance Calibration, NBS Special Publication 250-20 (U.S. Government Printing Office, 1987), http://www.physics.nist.gov/Divisions/Div844/manual/sp250series.html.
  7. C. E. Gibson and G. T. Fraser, Report of Calibration: Spectral Irradiance Standard, Quartz-Halogen Lamp (Serial # F-522) (NIST, 2001).
  8. J. L. Gardner, "Uncertainty propagation for NIST visible spectral standards," J. Res. Natl. Inst. Stand. Technol. 109, 305-318 (2004).
  9. J. L. Gardner, "Uncertainties in interpolated spectral data," J. Res. Natl. Inst. Stand. Technol. 108, 69-78 (2003).
  10. Y. Ohno, "Photometric standards," in Handbook of Applied Photometry, C. DeCusatis, ed. (Springer-Verlag, 1998), pp. 63-64.
  11. P. R. Bevington and D. K. Robinson, Data Reduction and Error Analysis for the Physical Sciences (McGraw-Hill, 2003), pp. 116-141.
  12. H. Oana, L. Jahreiss, D. Rich, and S. Trost, "Development and characterization of a miniature dual-channel spectrometer for spectrocolorimetry," in Optically Based Methods for Process Analysis, D. S. Bomse, H. Brittain, S. Farquharson, J. M. Lerner, A. J. Rein, C. Sohl, T. R. Todd, and L. Weyer, eds., Proc. SPIE 1681, 12-28 (1992). [CrossRef]
  13. D.-J. Shin, D.-H. Lee, C.-W. Park, and S.-N. Park, "A novel linearity tester for optical detectors using high-brightness light emitting diodes," Metrologia 42, 154-158 (2005). [CrossRef]
  14. Y. Zong, S. W. Brown, B. C. Johnson, K. R. Lykke, and Y. Ohno, "Simple spectral stray light correction method for array spectroradiometers," Appl. Opt. 45, 1111-1119 (2006). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited