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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 15 — May. 20, 2007
  • pp: 2949–2953

Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide

Youngchun Youk and Dug Young Kim  »View Author Affiliations


Applied Optics, Vol. 46, Issue 15, pp. 2949-2953 (2007)
http://dx.doi.org/10.1364/AO.46.002949


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Abstract

We introduce a very sensitive new configuration, to the best of our knowledge, in an optical microscope system that utilizes two detectors: one is to measure the power of a low reflected signal from a sample, and the other is only to monitor the confocal geometry of the system. With this new configuration, we could effectively remove measurement noise associated with small perturbation in measurement conditions such as surface curvature, tilt, and vibration in a microscope system. We have obtained a high-resolution relative index precision of 9 × 10 5 by employing this novel technique with two detectors.

© 2007 Optical Society of America

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(060.2300) Fiber optics and optical communications : Fiber measurements
(120.4640) Instrumentation, measurement, and metrology : Optical instruments

ToC Category:
Fiber Optics and Optical Communications

History
Original Manuscript: October 18, 2006
Manuscript Accepted: January 4, 2007
Published: May 1, 2007

Virtual Issues
Vol. 2, Iss. 6 Virtual Journal for Biomedical Optics

Citation
Youngchun Youk and Dug Young Kim, "Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide," Appl. Opt. 46, 2949-2953 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-15-2949


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