Optical properties of an optically rough coating from inversion of diffuse reflectance measurements
Applied Optics, Vol. 46, Issue 16, pp. 3133-3143 (2007)
http://dx.doi.org/10.1364/AO.46.003133
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Abstract
A method is developed for determining the optical properties of an optically rough coating on an opaque substrate from reflectance measurements. A modified Kubelka–Munk two- flux model is used to calculate the reflectance of the coating as a function of the refractive index, absorption coefficient, scattering coefficient, and thickness. The calculated reflectance is then fitted to measurements using a spectral projected gradient algorithm, allowing the optical properties to be obtained. The technique is applied to titanium dioxide coatings on a titanium substrate. Realistic values of refractive index and absorption coefficients are generally obtained. Quantities that are useful for solar water-splitting applications are calculated, including the depth profile of absorption and the proportion of the incident photon flux absorbed in the coating under solar illumination.
© 2007 Optical Society of America
OCIS Codes
(000.3860) General : Mathematical methods in physics
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5700) Instrumentation, measurement, and metrology : Reflection
(310.6860) Thin films : Thin films, optical properties
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: October 9, 2006
Revised Manuscript: January 12, 2007
Manuscript Accepted: January 15, 2007
Published: May 15, 2007
Citation
Anthony B. Murphy, "Optical properties of an optically rough coating from inversion of diffuse reflectance measurements," Appl. Opt. 46, 3133-3143 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-16-3133
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