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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 2 — Jan. 10, 2007
  • pp: 185–189

Measurements of the hard-x-ray reflectivity of iridium

S. Romaine, R. Bruni, P. Gorenstein, and Z. Zhong  »View Author Affiliations

Applied Optics, Vol. 46, Issue 2, pp. 185-189 (2007)

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In connection with the design of a hard-x-ray telescope for the Constellation X-Ray Observatory we measured the reflectivity of an iridium-coated zerodur substrate as a function of angle at 55, 60, 70, and 80 keV at the National Synchrotron Light Source of Brookhaven National Laboratory. The optical constants were derived from the reflectivity data. The real component of the index of refraction is in excellent agreement with theoretical values at all four energies. However, the imaginary component, which is related to the mass attenuation coefficient, is 50% to 70% larger at 55, 60, and 70 keV than theoretical values.

© 2007 Optical Society of America

OCIS Codes
(310.1620) Thin films : Interference coatings
(310.6860) Thin films : Thin films, optical properties
(340.0340) X-ray optics : X-ray optics
(340.7470) X-ray optics : X-ray mirrors
(350.1260) Other areas of optics : Astronomical optics

ToC Category:
X-ray Optics

Original Manuscript: July 7, 2006
Manuscript Accepted: August 30, 2006

S. Romaine, R. Bruni, P. Gorenstein, and Z. Zhong, "Measurements of the hard-x-ray reflectivity of iridium," Appl. Opt. 46, 185-189 (2007)

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