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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 22 — Aug. 1, 2007
  • pp: 5103–5109

Experimental study of the phase-shift miscalibration error in phase-shifting interferometry: use of a spectrally resolved white-light interferometer

Sanjit K. Debnath and Mahendra P. Kothiyal  »View Author Affiliations

Applied Optics, Vol. 46, Issue 22, pp. 5103-5109 (2007)

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The white-light interferogram in a spectrally resolved white-light interferometer is decomposed in its constituent spectral components by a spectrometer and displayed along its chromaticity axis. A piezoelectric transducer phase shifter in such an interferometer can give a desired phase shift of π / 2 only at one wavelength. The phase shift varies continuously at all other wavelengths along the chromaticity axis. This situation is ideal for an experimental study of the phase error due to the phase-shift error in the phase-shifting technique, as it will be shown in this paper.

© 2007 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:

Original Manuscript: February 7, 2007
Manuscript Accepted: March 19, 2007
Published: July 9, 2007

Sanjit K. Debnath and Mahendra P. Kothiyal, "Experimental study of the phase-shift miscalibration error in phase-shifting interferometry: use of a spectrally resolved white-light interferometer," Appl. Opt. 46, 5103-5109 (2007)

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