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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 22 — Aug. 1, 2007
  • pp: 5248–5256

Mechanical disturbances in Fourier spectrometers

Bortolino Saggin, Lorenzo Comolli, and Vittorio Formisano  »View Author Affiliations

Applied Optics, Vol. 46, Issue 22, pp. 5248-5256 (2007)

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Fourier spectrometers are sensitive to many kinds of disturbance. This focus is mainly on those connected to mechanical vibrations, assessing the relationships between the mechanical inputs and the deriving effects on the spectra. Mechanical vibrations have two main effects on the spectra, the addition of signals due to direct sensitivity to vibrations of the detectors (e.g., through piezoelectric effect) and the changes of the interferogram due to the interferometer optical components motion. The Fourier transform spectrometer considered in this study is based on the constant optical path step sampling achieved by using the interferogram of a reference laser as a trigger so, ideally insensitive to mirrors speed changes, however, the analysis will show how the effects of delays in the sampling chain can compromise the benefits of this configuration. The effects of the vibration of the interferometer optical alignment are considered as well, showing the effect produced on the interferograms and eventually on the spectra. Despite their nonmechanical nature, detector nonlinearity and internal optical reflections are considered as well because their effects, similar to the mechanical ones, could be confused with the latter while in spectra diagnostic it is often important to be able to distinguish between the two. For all the analyzed effects the quantitative relationships between the mechanical disturbances' amplitudes and spectral observed effects are derived.

© 2007 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.0300) Spectroscopy : Spectroscopy
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: February 8, 2007
Manuscript Accepted: March 14, 2007
Published: July 9, 2007

Bortolino Saggin, Lorenzo Comolli, and Vittorio Formisano, "Mechanical disturbances in Fourier spectrometers," Appl. Opt. 46, 5248-5256 (2007)

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  1. V. Formisano, D. Grassi, N. Ignatiev, L. Zasova, A. Maturilli, and the PFS team, "PFS for Mars Express: a new approach to study Martian atmosphere," Adv. Space Res. 29, 131-142 (2002). [CrossRef]
  2. V. Formisano, V. I. Moroz, F. Angrilli, G. Bianchini, E. Bussoletti, N. Cafaro, F. Capaccioni, M. T. Capria, P. Cerroni, G. Chionchio, L. Colangeli, A. Coradini, A. Di Lellis, S. Fonti, R. Orfei, E. Palomba, G. Piccioni, B. Saggin, A. Ekonomov, A. Grigorlev, V. Gnedykh, I. Khatuntsev, A. Kiselev, I. Matsygorin, B. Moshkin, V. Nechaev, Yu. Nikolsky, D. Patsaev, A. Russakov, D. Titov, L. Zasova, M. I. Blecka, A. Jurewicz, M. Michalska, W. Novosielski, P. Orleanski, G. Arnold, H. Hirsch, H. Driesher, J. Lopez-Moreno, R. Rodrigo, J. Rodriguez-Gomez, and G. Michel, "PFS: a Fourier spectrometer for the study of Martian atmosphere," Adv. Space Res. 19, 1277-1280 (1997). [CrossRef]
  3. H. Hirsh, V. Formisano, V. I. Moroz, V. Arnold, A. Jurewicz, G. Michel, J. J. Lopez-Moreno, G. Piccioni, and N. Cafaro, "The planetary Fourier spectrometer (PFS) for the orbiter of the spacecraft Mars96," Planet. Space Sci. 44, 889-897 (1996). [CrossRef]
  4. V. Formisano, V. I. Moroz, H. Hirsch, P. Orleanski, G. Michel, J. Lopez-Moreno, E. Amata, G. Bellucci, G. Piccioni, G. Chionchio, A. Carusi, A. Coradini, P. Cerroni, M. T. Capria, F. Capaccioni, A. Adriani, M. Vitterbini, F. Angrilli, G. Bianchini, B. Saggin, S. Fonti, E. Bussoletti, D. Mancini, L. Colangeli, A. Grigoriev, B. Moshkin, V. Gnedykh, I. A. Matsygorin, D. Patsaev, Yu. V. Nikolsky, D. V. Titov, L. V. Zasova, I. Khatuntsev, A. Kiselev, G. Arnold, H. Driesher, M. I. Blecka, R. Rodrigo, and J. Rodriguez-Gomez, "Infrared spectrometer PFS for the Mars94 orbiter," Adv. Space Res. 17, 61-64 (1996). [CrossRef]
  5. G. Piccioni, V. Formisano, and V. I. Moroz, "Extra-sampling and thermal behavior of diode lasers used as a reference source in a Fourier transform IR spectrometer," Appl. Opt. 36, 6774-6779 (1997). [CrossRef]
  6. R. C. M. Learner, A. P. Thorne, and J. W. Brault, "Ghosts and artifacts in Fourier-transform spectrometry," Appl. Opt. 35, 2947-2954 (1996). [CrossRef] [PubMed]
  7. T. J. Johnson, R. L. Sams, T. A. Blake, S. W. Sharpe, and P. M. Chu, "Removing aperture-induced artifacts from Fourier transform infrared intensity values," Appl. Opt. 41, 2831-2839 (2002). [CrossRef] [PubMed]
  8. L. A. Sromovsky, "Radiometric errors in complex Fourier transform spectrometry," Appl. Opt. 42, 1779-1786 (2003). [CrossRef] [PubMed]
  9. A. S. Zachor, "Drive nonlinearities: their effects in Fourier spectroscopy," Appl. Opt. 16, 1412-1424 (1977). [CrossRef] [PubMed]
  10. V. Formisano, D. Grassi, G. Piccioni, J. Pearl, R. Hanel, G. Bjoraker, and B. Conrath, "IRIS Mariner 9 data revisited: 1. An instrumental effect," Planet. Space Sci. 48, 569-576 (2000). [CrossRef]
  11. B. Moshkin and L. Zasova, "Nature of the ghosts of the 4.3 μm CO2 band in the SWC spectra of FM-PFS, obtained in the period 22.11-11.12, 2001," internal report of PFS team (2002).
  12. PFS team, "PFS instrument calibration report," Vols. I, II, and III, internal report of PFS team, (2002-2003).
  13. L. Comolli and B. Saggin, "Evaluation of the sensitivity to mechanical vibrations of an IR Fourier spectrometer," Rev. Sci. Instrum. 76, 123112 (2005). [CrossRef]
  14. L. Comolli and B. Saggin, "Effetti degli errori nel passo di campionamento sulla DFT: applicazione al caso di uno spettrometro di Fourier," in VI Congresso Nazionale di Misure Meccaniche e Termiche, Desenzano (BS) 2005 (University of Buscia, 2005) (in Italian).
  15. M. Toyoshima, T. Jono, N. Takahashi, T. Yamawaki, K. Nakagawa, and K. Arai, "Transfer function of microvibrational disturbances on a satellite," in Proceedings of 21st International Communications Satellite Systems Conference and Exhibit (American Institute of Aeronautics and Astronautics, 2003), paper 2003-2406.
  16. Y. C. Jenq, "Digital spectra of nonuniformly sampled signals: fundamentals and high speed waveform digitizers," IEEE Trans. Instrum. Meas. 37, 245-251 (1988). [CrossRef]
  17. M. R. Belmont, "An extension of Nyquist theorem to non-uniformly sampled finite-length data," Int. J. Adapt. Control Signal Process. 9, 163-181 (1995). [CrossRef]
  18. J. W. Brault, "New approach to high-precision Fourier transform spectrometer design," Appl. Opt. 35, 2891-2896 (1996). [CrossRef] [PubMed]
  19. E. E. Bell and R. B. Sanderson, "Spectral errors resulting from random sampling-position errors in Fourier transform spectroscopy," Appl. Opt. 11, 688-689 (1972). [CrossRef] [PubMed]
  20. D. L. Cohen, "Performance degradation of a Michelson interferometer due to random sampling errors," Appl. Opt. 38, 139-151 (1999). [CrossRef]
  21. L. Palchetti and D. Lastrucci, "Spectral noise due to sampling errors in Fourier-transform spectroscopy," Appl. Opt. 40, 3235-3243 (2001). [CrossRef]
  22. A. S. Zachor and S. M. Aaronson, "Delay compensation: its effect in reducing sampling errors in Fourier spectroscopy," Appl. Opt. 18, 68-75 (1979). [CrossRef] [PubMed]
  23. R. Hanel, B. Schlachman, E. Breihan, R. Bywaters, F. Chapman, M. Rhodes, D. Rodgers, and D. Vanous, "Mariner 9 Michelson Interferometer," Appl. Opt. 11, 2625-2634 (1972). [CrossRef] [PubMed]

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