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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 23 — Aug. 10, 2007
  • pp: 5635–5644

Accurate determination of the optical performances of antireflective coatings by low coherence reflectometry

Michel Lequime and Julien Lumeau  »View Author Affiliations

Applied Optics, Vol. 46, Issue 23, pp. 5635-5644 (2007)

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We propose to use optical low coherence reflectometry to measure the reflectance of both faces of a plane substrate with one side coated in antireflective layers. We identify, through a detailed theoretical analysis, the optimum configuration and evaluate the expected sensitivity and accuracy of some realistic examples. Finally, we experimentally demonstrate the ability of this method to quantify reflection coefficients as low as 5 × 10 7 . That way, an accurate characterization of the performances, at 1550   nm , of antireflective coatings deposited on various plane substrates is achieved.

© 2007 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(310.1210) Thin films : Antireflection coatings
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: February 6, 2007
Revised Manuscript: April 27, 2007
Manuscript Accepted: May 22, 2007
Published: August 8, 2007

Michel Lequime and Julien Lumeau, "Accurate determination of the optical performances of antireflective coatings by low coherence reflectometry," Appl. Opt. 46, 5635-5644 (2007)

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