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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 4 — Feb. 1, 2007
  • pp: 544–558

Coherence estimation in synthetic aperture radar data based on speckle noise modeling

Carlos López-Martínez and Eric Pottier  »View Author Affiliations


Applied Optics, Vol. 46, Issue 4, pp. 544-558 (2007)
http://dx.doi.org/10.1364/AO.46.000544


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Abstract

In the past we proposed a multidimensional speckle noise model to which we now include systematic phase variation effects. This extension makes it possible to define what is believed to be a novel coherence model able to identify the different sources of bias when coherence is estimated on multidimensional synthetic radar aperture (SAR) data. On the one hand, low coherence biases are basically due to the complex additive speckle noise component of the Hermitian product of two SAR images. On the other hand, the availability of the coherence model permits us to quantify the bias due to topography when multilook filtering is considered, permitting us to establish the conditions upon which information may be estimated independently of topography. Based on the coherence model, two coherence estimation approaches, aiming to reduce the different biases, are proposed. Results with simulated and experimental polarimetric and interferometric SAR data illustrate and validate both, the coherence model and the coherence estimation algorithms.

© 2007 Optical Society of America

OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(280.6730) Remote sensing and sensors : Synthetic aperture radar

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: July 7, 2006
Manuscript Accepted: August 28, 2006

Citation
Carlos López-Martínez and Eric Pottier, "Coherence estimation in synthetic aperture radar data based on speckle noise modeling," Appl. Opt. 46, 544-558 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-4-544


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