Analysis of stacked rotated gratings
Applied Optics, Vol. 46, Issue 8, pp. 1177-1183 (2007)
http://dx.doi.org/10.1364/AO.46.001177
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Abstract
We study the rigorous design and analysis of stacked rotated gratings (SRGs) for novel photonic devices. A concept of sampling frequency is proposed to systematically design SRGs. With the help of a rectangular sampling lattice, we extend the standard 3D rigorous coupled-wave analysis (RCWA) algorithm to the analysis of SRGs. The resultant SRG-RCWA algorithm can be used to exactly analyze SRGs that have grating parameters that match the Fourier expansion represented by the sampling lattice. SRGs that do not fall in this category can often still be closely approximated with our approach. The SRG-RCWA algorithm has been successfully applied to the characterization of two fabricated SRGs that are designed to function as circular polarization filters for an IR imaging polarimetry system. The agreement between numerical SRG-RCWA results and experimental measurements demonstrates its validity and usefulness.
© 2007 Optical Society of America
OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(050.1960) Diffraction and gratings : Diffraction theory
(230.5440) Optical devices : Polarization-selective devices
(260.5430) Physical optics : Polarization
History
Original Manuscript: March 1, 2006
Revised Manuscript: November 1, 2006
Manuscript Accepted: November 2, 2006
Published: February 20, 2007
Citation
Jianhua Jiang, Panfilo C. Deguzman, and Gregory P. Nordin, "Analysis of stacked rotated gratings," Appl. Opt. 46, 1177-1183 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-8-1177
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