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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 11 — Apr. 10, 2008
  • pp: 1705–1710

Measurement of steep aspheric surfaces using an anamorphic probe

Amiya Biswas and Jeremy Coupland  »View Author Affiliations


Applied Optics, Vol. 47, Issue 11, pp. 1705-1710 (2008)
http://dx.doi.org/10.1364/AO.47.001705


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Abstract

Synthetic aperture interferometry has been previously proposed as a possible in-process method to measure aspheric form (R. Tomlinson, et al., Appl. Opt. 42, 701, 2003.). Preliminary demonstration utilized a scanning probe consisting of a pair of bare single mode fibers to perform source and receive functions. It was found that this probe did not have sufficient numerical aperture (NA) to measure steep surfaces and that simply increasing the NA decreases the light gathering efficiency substantially. In this paper, we introduce supplementary optics to increase the NA, and the light gathering efficiency has been increased by adopting an anamorphic design. A spherical test optic of known form is measured to demonstrate the capability of the new probe design.

© 2008 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 9, 2007
Revised Manuscript: February 28, 2008
Manuscript Accepted: March 2, 2008
Published: April 7, 2008

Citation
Amiya Biswas and Jeremy Coupland, "Measurement of steep aspheric surfaces using an anamorphic probe," Appl. Opt. 47, 1705-1710 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-11-1705

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