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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 18 — Jun. 20, 2008
  • pp: 3369–3377

Reliability-guided phase unwrapping in wavelet-transform profilometry

Sikun Li, Wenjing Chen, and Xianyu Su  »View Author Affiliations


Applied Optics, Vol. 47, Issue 18, pp. 3369-3377 (2008)
http://dx.doi.org/10.1364/AO.47.003369


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Abstract

The phase unwrapping algorithm plays a very important role in many noncontact optical profilometries based on triangular measurement theory. Here we focus on discussing how to diminish the phase error caused by incorrect unwrapping path in wavelet transform profilometry. We employ the amplitude value map of wavelet transform coefficients at the wavelet-ridge position to identify the reliability of the phase data and the path of phase unwrapping. This means that the wrapped phase located at the pixel with the highest amplitude value will be selected as the starting point of the phase unwrapping, and that pixels with higher amplitude value will be unwrapped earlier. So the path of phase unwrapping is always in the direction of the pixel with highest amplitude value to the one with lowest amplitude value. Making full use of the amplitude information of wavelet coefficients at the wavelet-ridge position keeps the phase unwrapping error limited to local minimum areas even in the worst case. Computer simulations and experiments verify our theory.

© 2008 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(100.7410) Image processing : Wavelets
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(100.5088) Image processing : Phase unwrapping

ToC Category:
Image Processing

History
Original Manuscript: December 12, 2007
Revised Manuscript: May 19, 2008
Manuscript Accepted: May 20, 2008
Published: June 18, 2008

Citation
Sikun Li, Wenjing Chen, and Xianyu Su, "Reliability-guided phase unwrapping in wavelet-transform profilometry," Appl. Opt. 47, 3369-3377 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-18-3369

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