Phase, amplitude, and polarization microscopy with a sampling field sensor
Applied Optics, Vol. 47, Issue 19, pp. D96-D109 (2008)
http://dx.doi.org/10.1364/AO.47.000D96
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Abstract
I describe an improved implementation of a previously reported interferometric
device, the sampling field sensor (SFS) [
Appl. Opt.
47, B32–B43
(2008)]. It provides
X, Y, and
© 2008 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(170.0180) Medical optics and biotechnology : Microscopy
(180.3170) Microscopy : Interference microscopy
(350.5030) Other areas of optics : Phase
(090.1995) Holography : Digital holography
History
Original Manuscript: October 1, 2007
Revised Manuscript: December 21, 2007
Manuscript Accepted: January 14, 2008
Published: March 19, 2008
Virtual Issues
Vol. 3, Iss. 8 Virtual Journal for Biomedical Optics
Citation
Remy Tumbar, "Phase, amplitude, and polarization microscopy with a sampling field sensor," Appl. Opt. 47, D96-D109 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-19-D96
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