Abstract
We present a new type of quadrature phase-shifting interferometer, which utilizes wave plates, a diffraction grating, and two lasers with different wavelengths, in order to acquire two sets of two quadrature fringe patterns in each wavelength formed on a single image sensor. This method for calculating with four phase-shifted fringe patterns gives us the phase sum and difference distributions between the phases in two wavelengths. This is also substantiated by results of our experiments.
© 2008 Optical Society of America
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