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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 29 — Oct. 10, 2008
  • pp: 5442–5445

Transmission-type angle deviation microscopy

Ming-Hung Chiu, Chih-Wen Lai, Chen-Tai Tan, and Chin-Fa Lai  »View Author Affiliations

Applied Optics, Vol. 47, Issue 29, pp. 5442-5445 (2008)

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We present a new microscopy technique that we call transmission angle deviation microscopy (TADM). It is based on common-path heterodyne interferometry and geometrical optics. An ultrahigh sensitivity surface plasmon resonance (SPR) angular sensor is used to expand dynamic measurement ranges and to improve the axial resolution in three-dimensional optical microscopy. When transmitted light is incident upon a specimen, the beam converges or diverges because of refractive and/or surface height variations. Advantages include high axial resolution ( 32 nm ), nondestructive and noncontact measurement, and larger measurement ranges ( ± 80 μm ) for a numerical aperture of 0.21in a transparent measurement medium. The technique can be used without conductivity and pretreatment.

© 2008 Optical Society of America

OCIS Codes
(040.2840) Detectors : Heterodyne
(050.5080) Diffraction and gratings : Phase shift
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(180.5810) Microscopy : Scanning microscopy
(240.6680) Optics at surfaces : Surface plasmons

ToC Category:

Original Manuscript: June 16, 2008
Revised Manuscript: September 4, 2008
Manuscript Accepted: September 9, 2008
Published: October 8, 2008

Virtual Issues
Vol. 3, Iss. 12 Virtual Journal for Biomedical Optics

Ming-Hung Chiu, Chih-Wen Lai, Chen-Tai Tan, and Chin-Fa Lai, "Transmission-type angle deviation microscopy," Appl. Opt. 47, 5442-5445 (2008)

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