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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 7 — Mar. 1, 2008
  • pp: 920–924

Diagonal scan measurement of Cr:LiSAF 20 ps ablation threshold

Ricardo Elgul Samad, Sonia Licia Baldochi, and Nilson Dias Vieira, Jr.  »View Author Affiliations


Applied Optics, Vol. 47, Issue 7, pp. 920-924 (2008)
http://dx.doi.org/10.1364/AO.47.000920


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Abstract

We report the measurement of the 20 ps ablation threshold of pure and Cr 3 + doped LiSAF samples using a simple method that employs a single scan of the sample across a focused laser beam waist. During the scan, a profile is etched in the sample surface, and the measurement of the maximum transversal size of the profile and the pulse peak power determine the ablation threshold, without any further knowledge of the beam geometry. Also, it was possible to measure the depth of the ablation profile, to calculate its effective volume, and to identify that the maximum material removal rate per pulse does not occur at the beam waist, which is not intuitively expected.

© 2008 Optical Society of America

OCIS Codes
(140.3390) Lasers and laser optics : Laser materials processing
(220.4610) Optical design and fabrication : Optical fabrication
(320.5390) Ultrafast optics : Picosecond phenomena
(320.7120) Ultrafast optics : Ultrafast phenomena
(320.7130) Ultrafast optics : Ultrafast processes in condensed matter, including semiconductors

ToC Category:
Ultrafast Optics

History
Original Manuscript: December 14, 2007
Manuscript Accepted: December 20, 2007
Published: February 28, 2008

Citation
Ricardo Elgul Samad, Sonia Licia Baldochi, and Nilson Dias Vieira, Jr., "Diagonal scan measurement of Cr:LiSAF 20 ps ablation threshold," Appl. Opt. 47, 920-924 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-7-920


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References

  1. N. Bloembergen, “Laser-induced electric breakdown in solids,” IEEE J. Quantum Electron. 10, 375-386 (1974). [CrossRef]
  2. D. Du, X. Liu, G. Korn, J. Squier, and G. Mourou, “Laser-induced breakdown by impact ionization in SiO2 with pulse widths from 7 ns to 150 fs,” Appl. Phys. Lett. 64, 3071-3073(1994). [CrossRef]
  3. M. D. Perry, B. C. Stuart, P. S. Banks, M. D. Feit, V. Yanovsky, and A. M. Rubenchik, “Ultrashort-pulse laser machining of dielectric materials,” J. Appl. Phys. 85, 6803-6810 (1999). [CrossRef]
  4. W. Kautek, J. Kruger, M. Lenzner, S. Sartania, C. Spielmann, and F. Krausz, “Laser ablation of dielectrics with pulse durations between 20 fs and 3 ps,” Appl. Phys. Lett. 69, 3146-3148(1996). [CrossRef]
  5. L. V. Keldysh, “Ionization in the field of a strong electromagnetic wave,” Sov. Phys. JETP 20, 1307-1314 (1965).
  6. M. Lenzner, J. Kruger, S. Sartania, Z. Cheng, C. Spielmann, G. Mourou, W. Kautek, and F. Krausz, “Femtosecond optical breakdown in dielectrics,” Phys. Rev. Lett. 80, 4076-4079(1998). [CrossRef]
  7. M. Uiberacker, T. Uphues, M. Schultze, A. J. Verhoef, V. Yakovlev, M. F. Kling, J. Rauschenberger, N. M. Kabachnik, H. Schroder, M. Lezius, K. L. Kompa, H. G. Muller, M. J. J. Vrakking, S. Hendel, U. Kleineberg, U. Heinzmann, M. Drescher, and F. Krausz, “Attosecond real-time observation of electron tunnelling in atoms,” Nature 446, 627-632 (2007). [CrossRef] [PubMed]
  8. A. P. Joglekar, H. Liu, G. J. Spooner, E. Meyhofer, G. Mourou, and A. J. Hunt, “A study of the deterministic character of optical damage by femtosecond laser pulses and applications to nanomachining,” Appl. Phys. B 77, 25-30 (2003). [CrossRef]
  9. M. Bass and D. W. Fradin, “Surface and bulk laser-damage statistics and the identification of intrinsic breakdown processes,” IEEE J. Quantum Electron. 9, 890-896 (1973). [CrossRef]
  10. S. Nolte, C. Momma, H. Jacobs, A. Tunnermann, B. N. Chichkov, B. Wellegehausen, and H. Welling, “Ablation of metals by ultrashort laser pulses,” J. Opt. Soc. Am. B 14, 2716-2722(1997). [CrossRef]
  11. E. G. Gamaly, A. V. Rode, B. Luther-Davies, and V. T. Tikhonchuk, “Ablation of solids by femtosecond lasers: ablation mechanism and ablation thresholds for metals and dielectrics,” Phys. Plasmas 9, 949-957 (2002). [CrossRef]
  12. J. M. Liu, “Simple technique for measurements of pulsed Gaussian-beam spot sizes,” Opt. Lett. 7, 196-198 (1982). [CrossRef] [PubMed]
  13. R. E. Samad and N. D. Vieira, “Geometrical method for determining the surface damage threshold for femtosecond laser pulses,” Laser Phys. 16, 336-339 (2006). [CrossRef]
  14. M. Ruiz, E. A. Barbosa, E. P. Maldonado, S. P. Morato, N. U. Wetter, N. D. Vieira, and S. L. Baldochi, “Zone melting growth of LiSrAlF6:Cr crystals for diode laser pumping,” J. Cryst. Growth 241, 177-182 (2002). [CrossRef]
  15. S. L. Baldochi and S. P. Morato, “Fluoride bulk crystals growth,” in Encyclopedia of Materials: Science and Technology, K. H. J. Buschow, R. W. Cahn, M. C. Flemings, B. Ilschner, E. J. Kramer, and S. Mahajan, eds. (Pergamon, 2001), pp. 3200-3205. [CrossRef]
  16. VLOC, retrieved http://www.vloc.com/vlochome.htm.
  17. J. J. De Yoreo, L. J. Atherton, and D. H. Roberts, “Elimination of scattering centers from Cr:LiCaAlF6,” J. Cryst. Growth 113, 691-697 (1991). [CrossRef]

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