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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 15 — May. 20, 2009
  • pp: 2890–2898

Direct reconstruction of an object from dual exposure Fourier intensity measurements

Tae Moon Jeong, Jong Rak Park, Do-Kyeong Ko, and Jongmin Lee  »View Author Affiliations


Applied Optics, Vol. 48, Issue 15, pp. 2890-2898 (2009)
http://dx.doi.org/10.1364/AO.48.002890


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Abstract

The reconstruction of an object with a method using a dual exposure single inverse Fourier transform is investigated. The method calculates phase information in the Fourier plane to perform the inverse Fourier transform. The phase information in the Fourier plane is calculated from the intensity distributions formed by an object with and without a reference electric field. The method successfully reconstructs an object in a simple and fast manner. For the practical use of the method, the effects of the intensity digitization and the noise in the intensity distributions are examined in reconstructing an object.

© 2009 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(100.3010) Image processing : Image reconstruction techniques
(110.3010) Imaging systems : Image reconstruction techniques

ToC Category:
Image Processing

History
Original Manuscript: November 5, 2008
Revised Manuscript: April 19, 2009
Manuscript Accepted: April 21, 2009
Published: May 15, 2009

Citation
Tae Moon Jeong, Jong Rak Park, Do-Kyeong Ko, and Jongmin Lee, "Direct reconstruction of an object from dual exposure Fourier intensity measurements," Appl. Opt. 48, 2890-2898 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-15-2890


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