OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 16 — Jun. 1, 2009
  • pp: 3084–3093

Measurement of dysprosium optical constants in the 2 830 eV spectral range using a transmittance method, and compilation of the revised optical constants of lanthanum, terbium, neodymium, and gadolinium

Benjawan Kjornrattanawanich, David L. Windt, Jeffrey A. Bellotti, and John F.Seely  »View Author Affiliations


Applied Optics, Vol. 48, Issue 16, pp. 3084-3093 (2009)
http://dx.doi.org/10.1364/AO.48.003084


View Full Text Article

Enhanced HTML    Acrobat PDF (1193 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The optical constants β, δ of the complex refractive index ( n ˜ = 1 δ + i β ) of Dy were obtained in the 2 830 eV energy range using a novel transmittance method. Si/W/Dy/W films were deposited by dc- magnetron sputtering on Si photodiode substrates, and the transmittance was characterized using synchrotron radiation. The extinction coefficients β of Dy and the transmittance of a Si capping layer and two W interface barrier layers as functions of energy were solved simultaneously using a nonlinear optimization routine. The measured transmittances of the capping and barrier layers were primarily used as indicators for any flaws in the transmittance results. The dispersion coefficients δ of Dy were calculated using the Kramers–Kronig integral, and a complete set of β values required for this integral was obtained by combining the present data with data from the literature. Sum rule tests on Dy show some deficiencies in the present data, which may be attributed to lower film density compared with the bulk value. Similar procedures were applied to previously measured transmittances of B 4 C / La , Si/Tb, Si/Nd, and Si/Gd films, where B 4 C or Si were used as capping layers on those reactive rare-earth films. The improved sets of transmittance values of B 4 C and Si capping layers were used as input in the optimization routine to solve for more accurate β values of La, Tb, Nd, and Gd. The revised optical constants of these materials, tested for consistency with partial sum rules, are also reported.

© 2009 Optical Society of America

OCIS Codes
(310.6860) Thin films : Thin films, optical properties
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)

ToC Category:
Thin Films

History
Original Manuscript: March 26, 2009
Revised Manuscript: April 24, 2009
Manuscript Accepted: April 27, 2009
Published: May 26, 2009

Citation
Benjawan Kjornrattanawanich, David L. Windt, Jeffrey A. Bellotti, and John F.Seely, "Measurement of dysprosium optical constants in the 2-830 eV spectral range using a transmittance method, and compilation of the revised optical constants of lanthanum, terbium, neodymium, and gadolinium," Appl. Opt. 48, 3084-3093 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-16-3084

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited