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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 17 — Jun. 10, 2009
  • pp: 3165–3169

Optical density measurement of thin-film transistor liquid crystal display by a monochrome light-emitting diode

Fu-Ming Tzu and Jung-Hua Chou  »View Author Affiliations

Applied Optics, Vol. 48, Issue 17, pp. 3165-3169 (2009)

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A new method using a monochromatic light-emitting diode (LED) to measure the optical density (OD) of the black matrix of thin-film transistor liquid crystal display (LCD) is developed in this study. The measured results show that the average OD difference is within 1% between the proposed 3 W monochromatic LED and the currently adopted 100 W quartz halogen lamp. On the other hand, the monochromatic LED reduces the boosting time by 40% in establishing the baseline database. The 3 σ standard deviation of the OD of the test samples is from 0.1% to 0.6% for the LED, whereas it is from 0.5% to 1.2% for the halogen lamp. Using standard glass samples, the monochromatic LED demonstrates accuracy within 1.58%, better than that of the quartz halogen lamp. Therefore, it can substitute for the quartz halogen lamp currently used in the thin-film transistor LCD industry for OD measurement of the black matrix layer, as it is faster, is more accurate, is more reliable, and consumes less power.

© 2009 Optical Society of America

OCIS Codes
(120.2040) Instrumentation, measurement, and metrology : Displays
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.4820) Instrumentation, measurement, and metrology : Optical systems

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: January 12, 2009
Revised Manuscript: May 1, 2009
Manuscript Accepted: May 4, 2009
Published: June 1, 2009

Fu-Ming Tzu and Jung-Hua Chou, "Optical density measurement of thin-film transistor liquid crystal display by a monochrome light-emitting diode," Appl. Opt. 48, 3165-3169 (2009)

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