Probing technique using circular motion of a microsphere controlled by optical pressure for a nanocoordinate measuring machine
Applied Optics, Vol. 48, Issue 2, pp. 198-205 (2009)
http://dx.doi.org/10.1364/AO.48.000198
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Abstract
A new surface probing technique using the circular motion of an optically-trapped microsphere is proposed for a nanocoordinate measuring system. The probe sphere is oscillated circularly in the plane perpendicular to the probe axis and the circular orbit of the probe sphere is monitored for the detection of the position and normal vector direction of the surface. The principle of detection is based on changes in the circular orbit of the microsphere. When the probe approaches a work surface, the orbit of the probe sphere becomes elliptical. The minor-axis length and the minor-axis angle of the ellipse are then used as parameters to detect the position and normal vector direction of the surface, respectively. In this study, the circular motion probe is shown to have a resolution of position detection of
© 2009 Optical Society of America
OCIS Codes
(120.1880) Instrumentation, measurement, and metrology : Detection
(350.4855) Other areas of optics : Optical tweezers or optical manipulation
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: July 14, 2008
Revised Manuscript: November 19, 2008
Manuscript Accepted: November 28, 2008
Published: January 7, 2009
Citation
Masaki Michihata, Yuto Nagasaka, Terutake Hayashi, and Yasuhiro Takaya, "Probing technique using circular motion of a microsphere controlled by optical pressure for a nanocoordinate measuring machine," Appl. Opt. 48, 198-205 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-2-198
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