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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 23 — Aug. 10, 2009
  • pp: 4582–4596

Robust three-dimensional best-path phase-unwrapping algorithm that avoids singularity loops

Hussein Abdul-Rahman, Miguel Arevalillo-Herráez, Munther Gdeisat, David Burton, Michael Lalor, Francis Lilley, Christopher Moore, Daniel Sheltraw, and Mohammed Qudeisat  »View Author Affiliations


Applied Optics, Vol. 48, Issue 23, pp. 4582-4596 (2009)
http://dx.doi.org/10.1364/AO.48.004582


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Abstract

In this paper we propose a novel hybrid three-dimensional phase-unwrapping algorithm, which we refer to here as the three-dimensional best-path avoiding singularity loops (3DBPASL) algorithm. This algorithm combines the advantages and avoids the drawbacks of two well-known 3D phase-unwrapping algorithms, namely, the 3D phase-unwrapping noise-immune technique and the 3D phase-unwrapping best-path technique. The hybrid technique presented here is more robust than its predecessors since it not only follows a discrete unwrapping path depending on a 3D quality map, but it also avoids any singularity loops that may occur in the unwrapping path. Simulation and experimental results have shown that the proposed algorithm outperforms its parent techniques in terms of reliability and robustness.

© 2009 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(100.5070) Image processing : Phase retrieval
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Image Processing

History
Original Manuscript: April 22, 2009
Revised Manuscript: July 3, 2009
Manuscript Accepted: July 10, 2009
Published: August 4, 2009

Citation
Hussein Abdul-Rahman, Miguel Arevalillo-Herráez, Munther Gdeisat, David Burton, Michael Lalor, Francis Lilley, Christopher Moore, Daniel Sheltraw, and Mohammed Qudeisat, "Robust three-dimensional best-path phase-unwrapping algorithm that avoids singularity loops," Appl. Opt. 48, 4582-4596 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-23-4582

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