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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 30 — Oct. 20, 2009
  • pp: 5704–5712

Measurement of two dimensional refractive index profiles of channel waveguides using an interferometric technique

R. Oven  »View Author Affiliations

Applied Optics, Vol. 48, Issue 30, pp. 5704-5712 (2009)

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Two dimensional refractive index profiles of ion exchanged channel waveguides in glass have been measured using an interferometric method. In order to obtain depth data, a shallow bevel is produced in the glass by polishing. A regularization algorithm for the extraction of the phase data from the interferometer image is presented. The method is applied to waveguides formed by the electric field assisted diffusion of Cu + ions into a borosilicate glass. The index change obtained from the interferometer is in good agreement with that obtained from measurements on planar waveguides.

© 2009 Optical Society of America

OCIS Codes
(180.3170) Microscopy : Interference microscopy
(230.7380) Optical devices : Waveguides, channeled

ToC Category:
Optical Devices

Original Manuscript: June 5, 2009
Revised Manuscript: September 25, 2009
Manuscript Accepted: September 25, 2009
Published: October 13, 2009

R. Oven, "Measurement of two dimensional refractive index profiles of channel waveguides using an interferometric technique," Appl. Opt. 48, 5704-5712 (2009)

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