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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 30 — Oct. 20, 2009
  • pp: 5718–5721

Optical near-field study of photonic crystal tapers

Delphine Néel, Taha Benyattou, Pablo Sanchis, Javier Martí, Wim Bogaerts, Pieter Dumon, and Roel Baets  »View Author Affiliations

Applied Optics, Vol. 48, Issue 30, pp. 5718-5721 (2009)

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A scanning near-field optical microscopy study is undertaken on photonic crystal tapers. These tapers are used to couple a 3 μm wide multimode dielectric waveguide to a single-line defect monomode photonic crystal waveguide. Two kinds of taper, with or without a localized defect, are compared. Higher transmission efficiency is obtained when a defect is utilized. The near-field study at 1550 nm shows experimentally that this defect prevents leaky resonant states to appear in the taper and thus permits a decrease in out-of-plane losses. These observations are supported by band diagram calculations.

© 2009 Optical Society of America

OCIS Codes
(230.0250) Optical devices : Optoelectronics
(250.5300) Optoelectronics : Photonic integrated circuits
(180.4243) Microscopy : Near-field microscopy
(130.5296) Integrated optics : Photonic crystal waveguides
(160.5298) Materials : Photonic crystals

ToC Category:

Original Manuscript: June 5, 2009
Revised Manuscript: October 6, 2009
Manuscript Accepted: October 6, 2009
Published: October 20, 2009

Delphine Néel, Taha Benyattou, Pablo Sanchis, Javier Martí, Wim Bogaerts, Pieter Dumon, and Roel Baets, "Optical near-field study of photonic crystal tapers," Appl. Opt. 48, 5718-5721 (2009)

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