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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 30 — Oct. 20, 2009
  • pp: 5774–5781

Polarimetric stellar interferometry by use of birefringent retarders

Naoshi Murakami, Naoko Ohishi, Jun Nishikawa, and Masanori Yoshizawa  »View Author Affiliations

Applied Optics, Vol. 48, Issue 30, pp. 5774-5781 (2009)

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We propose a polarimetric technique for a stellar interferometer that uses two birefringent retarders inserted into each arm of the interferometer. The retarders shift the interference fringes of the two orthogonal polarizations to opposite directions along an optical path difference (OPD), which enables us to measure the polarized fringe visibilities separately. Laboratory demonstrations were carried out using quartz retarders with a thickness of 1.124 mm , and the separation of the interferometric fringes of ± 10 μm along the OPD was observed. We discuss a calibration method for the acquired fringes to obtain reliable estimations of polarized fringe visibilities. We also discuss feasibility of the proposed technique for the Mitaka optical InfraRed Array (MIRA-I.2).

© 2009 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.1440) Physical optics : Birefringence
(260.5430) Physical optics : Polarization

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: April 6, 2009
Revised Manuscript: August 9, 2009
Manuscript Accepted: October 2, 2009
Published: October 15, 2009

Naoshi Murakami, Naoko Ohishi, Jun Nishikawa, and Masanori Yoshizawa, "Polarimetric stellar interferometry by use of birefringent retarders," Appl. Opt. 48, 5774-5781 (2009)

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