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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 30 — Oct. 20, 2009
  • pp: 5849–5852

Reducing the effect of integrating sphere speckle when characterizing the instrument line shape of a Fourier-transform hyperspectral imager

Simon Potvin and Jérôme Genest  »View Author Affiliations

Applied Optics, Vol. 48, Issue 30, pp. 5849-5852 (2009)

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The contribution of integrating sphere speckle pattern on the instrument line shape of a Fourier- transform hyperspectral imager is investigated. A new measurement technique that minimizes the speckle effect is presented. This technique consists of agitating the sphere while integrating with the instrument camera. Experimental results are presented that show the speckle effect on the instrument line shape and how it can be removed. This work is motivated by the constant goal of better identification and correction of the instrument line shape.

© 2009 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms
(110.4234) Imaging systems : Multispectral and hyperspectral imaging

ToC Category:

Original Manuscript: July 29, 2009
Revised Manuscript: October 2, 2009
Manuscript Accepted: October 6, 2009
Published: October 19, 2009

Simon Potvin and Jérôme Genest, "Reducing the effect of integrating sphere speckle when characterizing the instrument line shape of a Fourier-transform hyperspectral imager," Appl. Opt. 48, 5849-5852 (2009)

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