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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 32 — Nov. 10, 2009
  • pp: 6290–6295

Edge enhancement for in-phase focal modulation microscope

Ke Si, Wei Gong, Nanguang Chen, and Colin J.R. Sheppard  »View Author Affiliations

Applied Optics, Vol. 48, Issue 32, pp. 6290-6295 (2009)

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In-phase focal modulation microscopy (IPFMM) with single photon excited fluorescence is presented. Optical transfer functions and images of thin and thick fluorescent edges in IPFMM are investigated. The results show that, compared with confocal microscopy, using IPFMM can result in a sharper image of the edge, and the edge gradient can be increased up to 75.4% and 58.9% for a thick edge and a thin edge, respectively. Signal level is also discussed, and the results show that, to obtain high transverse resolution with IPFMM, the normalized detector pinhole radius should not exceed 2.8.

© 2009 Optical Society of America

OCIS Codes
(170.1530) Medical optics and biotechnology : Cell analysis
(170.3660) Medical optics and biotechnology : Light propagation in tissues
(170.4580) Medical optics and biotechnology : Optical diagnostics for medicine
(170.6510) Medical optics and biotechnology : Spectroscopy, tissue diagnostics
(290.0290) Scattering : Scattering

ToC Category:

Original Manuscript: July 24, 2009
Revised Manuscript: October 7, 2009
Manuscript Accepted: October 10, 2009
Published: November 5, 2009

Virtual Issues
Vol. 4, Iss. 13 Virtual Journal for Biomedical Optics

Ke Si, Wei Gong, Nanguang Chen, and Colin J.R. Sheppard, "Edge enhancement for in-phase focal modulation microscope," Appl. Opt. 48, 6290-6295 (2009)

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