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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 1 — Jan. 1, 2010
  • pp: 32–36

Optical high-power nonlinearity comparison between the National Institute of Standards and Technology and the National Metrology Institute of Japan at 1480 nm

I. Vayshenker, S. Yang, K. Amemiya, S. Mukai, and T. Zama  »View Author Affiliations


Applied Optics, Vol. 49, Issue 1, pp. 32-36 (2010)
http://dx.doi.org/10.1364/AO.49.000032


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Abstract

We compare the results of measurements of the nonlinearity of high-power optical fiber powermeters (OFPMs) by two national metrology institutes (NMIs): the National Institute of Standards and Technology (NIST-USA) and the National Metrology Institute of Japan/National Institute of Advanced Industrial Science and Technology (NMIJ/AIST-Japan) at a wavelength of 1480 nm . The nonlinearity and range discontinuity of a commercial OFPM were measured from 1 mW to 500 mW by use of a superposition method (both laboratories) and from 1 mW to 250 mW by use of a comparison method (NMIJ only). Measurement results showed largest differences of less than 1.6 parts in 10 3 , which is within the combined expanded ( k = 2 ) uncertainty for both laboratories.

© 2010 Optical Society of America

OCIS Codes
(040.3060) Detectors : Infrared
(060.2380) Fiber optics and optical communications : Fiber optics sources and detectors
(120.3940) Instrumentation, measurement, and metrology : Metrology

ToC Category:
Fiber Optics and Optical Communications

History
Original Manuscript: July 29, 2009
Revised Manuscript: November 25, 2009
Manuscript Accepted: November 30, 2009
Published: December 23, 2009

Citation
I. Vayshenker, S. Yang, K. Amemiya, S. Mukai, and T. Zama, "Optical high-power nonlinearity comparison between the National Institute of Standards and Technology and the National Metrology Institute of Japan at 1480 nm," Appl. Opt. 49, 32-36 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-1-32


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References

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