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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 22 — Aug. 1, 2010
  • pp: 4228–4236

Extraction of phase derivative data from interferometer images using a continuous wavelet transform to determine two-dimensional refractive index profiles

R. Oven  »View Author Affiliations


Applied Optics, Vol. 49, Issue 22, pp. 4228-4236 (2010)
http://dx.doi.org/10.1364/AO.49.004228


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Abstract

Two-dimensional refractive index profiles of ion exchanged channel waveguides in glass have been obtained from the analysis of interferometer data. To obtain depth data, a shallow bevel is produced in the glass by polishing. The refractive index profile information that is contained within the derivative of the phase data is extracted directly using a continuous wavelet transform algorithm. The algorithm used to characterize and smooth the wavelet ridge is discussed in detail.

© 2010 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(100.7410) Image processing : Wavelets
(180.3170) Microscopy : Interference microscopy
(230.7380) Optical devices : Waveguides, channeled

ToC Category:
Image Processing

History
Original Manuscript: April 23, 2010
Revised Manuscript: July 1, 2010
Manuscript Accepted: July 2, 2010
Published: July 27, 2010

Citation
R. Oven, "Extraction of phase derivative data from interferometer images using a continuous wavelet transform to determine two-dimensional refractive index profiles," Appl. Opt. 49, 4228-4236 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-22-4228

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