Pixel crosstalk (CTK) consists of three components, optical CTK (OCTK), electrical CTK (ECTK), and spectral CTK (SCTK). The CTK has been classified into two groups: pixel-architecture dependent and pixel-architecture independent. The pixel-architecture-dependent CTK (PADC) consists of the sum of two CTK components, i.e., the OCTK and the ECTK. This work presents a short summary of a large variety of methods for PADC reduction. Following that, this work suggests a clear quantifiable definition of PADC. Three complementary metal-oxide-semiconductor (CMOS) image sensors based on different technologies were empirically measured, using a unique scanning technology, the S-cube. The PADC is analyzed, and technology trends are shown.
© 2010 Optical Society of America
Original Manuscript: March 15, 2010
Revised Manuscript: July 9, 2010
Manuscript Accepted: July 16, 2010
Published: August 11, 2010
Lior Blockstein and Orly Yadid-Pecht, "Crosstalk quantification, analysis, and trends in CMOS image sensors," Appl. Opt. 49, 4483-4488 (2010)