Return-path, multiple-principal-angle, internal-reflection ellipsometer for measuring IR optical properties of aqueous solutions
Applied Optics, Vol. 49, Issue 25, pp. 4710-4714 (2010)
http://dx.doi.org/10.1364/AO.49.004710
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Abstract
A retroreflection (return-path) spectroscopic ellipsometer without a wave plate is described that uses an IR-transparent high-refractive-index hemicylindrical semiconductor substrate to measure the optical properties of aqueous solutions from multiple principal angles and multiple principal azimuths of atten uated internal reflection (AIR) at the semiconductor–solution interface. The pseudo-Brewster angle of minimum reflectance for the p polarization is also readily measured using the same instrument. This wealth of data can also be used to characterize thin films at the solid–liquid interface. Simulated results of AIR at the Si–water interface over the
© 2010 Optical Society of America
OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.4760) Materials : Optical properties
(240.0240) Optics at surfaces : Optics at surfaces
(260.5430) Physical optics : Polarization
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: June 18, 2010
Manuscript Accepted: July 26, 2010
Published: August 24, 2010
Virtual Issues
Vol. 5, Iss. 13 Virtual Journal for Biomedical Optics
Citation
R. M. A. Azzam, "Return-path, multiple-principal-angle, internal-reflection ellipsometer for measuring IR optical properties of aqueous solutions," Appl. Opt. 49, 4710-4714 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-25-4710
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