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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 4 — Feb. 1, 2010
  • pp: 701–707

Lateral resolution enhancement in confocal microscopy by vectorial aperture engineering

B. R. Boruah  »View Author Affiliations

Applied Optics, Vol. 49, Issue 4, pp. 701-707 (2010)

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This article reports the design and implementation of a lateral resolution-enhancement technique in confocal microscopy that can work, in principle, either in the reflection mode or in the fluorescence mode. Taking the difference between two images corresponding to two different vectorially (involving amplitude, phase, and polarization of light) engineered illumination pupils or apertures of a confocal microscope, high spatial frequency contents in the resultant image can be significantly enhanced. This can be realized by incorporating an extra vectorial beam-forming element into the illumination beam path of a conventional confocal microscope. The method of the proposed technique has been explained by giving it an analytical treatment supported by numerical simulation results. The technique has been implemented in a reflection mode confocal microscope and results obtained are presented.

© 2010 Optical Society of America

OCIS Codes
(110.4850) Imaging systems : Optical transfer functions
(180.1790) Microscopy : Confocal microscopy
(230.6120) Optical devices : Spatial light modulators
(330.6130) Vision, color, and visual optics : Spatial resolution

ToC Category:

Original Manuscript: September 16, 2009
Revised Manuscript: December 8, 2009
Manuscript Accepted: December 11, 2009
Published: January 27, 2010

Virtual Issues
Vol. 5, Iss. 4 Virtual Journal for Biomedical Optics

B. R. Boruah, "Lateral resolution enhancement in confocal microscopy by vectorial aperture engineering," Appl. Opt. 49, 701-707 (2010)

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