Abstract

The speckle grain close to a diffuser medium carries information about the angles at which light is scattered. We propose the extension of a technique that allows obtaining the angular distribution of the scattered intensity in the far-field speckle pattern from the near-field speckle pattern produced by strong diffusers (whose roughness is greater than the illuminating wavelength). To illustrate this technique we applied it to the light scattered from ground glass diffusers. The experimental results are compared with those obtained by direct measurement of the angular distribution of the mean scattered intensity in the far field showing good agreement with each other. The advantages over the classical far-field methods are outlined.

© 2010 Optical Society of America

Surface characterization from doubly scattered light

Fernando Perez-Quintián and María A. Rebollo
Appl. Opt. 43(14) 2884-2887 (2004)

Angular correlation function of speckle patterns scattered from a one-dimensional rough dielectric film on a glass substrate

Jun Q. Lu and Zu-Han Gu
Appl. Opt. 36(19) 4562-4570 (1997)

Diffuser radiation patterns over a large dynamic range. 1: Strong diffusers

Lyle G. Shirley and Nicholas George
Appl. Opt. 27(9) 1850-1861 (1988)

Spatially resolved surface topography retrieved from far-field intensity scattering measurements

Myriam Zerrad, Michel Lequime, and Claude Amra
Appl. Opt. 53(4) A297-A304 (2014)

Near-field intensity correlations of scattered light

Marzio Giglio, Marina Carpineti, Alberto Vailati, and Doriano Brogioli
Appl. Opt. 40(24) 4036-4040 (2001)