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High-resolution 3D profilometry with binary phase-shifting methods |
Applied Optics, Vol. 50, Issue 12, pp. 1753-1757 (2011)
http://dx.doi.org/10.1364/AO.50.001753
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Abstract
This paper presents a novel pixel-level resolution 3D profilometry technique that only needs binary phase-shifted structured patterns. This technique uses four sets of three phase-shifted binary patterns to achieve the phase error of less than 0.2%, and only requires two sets to reach similar quality if the projector is slightly defocused. Theoretical analysis, simulations, and experiments will be presented to verify the performance of the proposed technique.
© 2011 Optical Society of America
OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: November 11, 2010
Manuscript Accepted: February 28, 2011
Published: April 15, 2011
Citation
Song Zhang, "High-resolution 3D profilometry with binary phase-shifting methods," Appl. Opt. 50, 1753-1757 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-12-1753
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