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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 25 — Sep. 1, 2011
  • pp: 4927–4935

Study of image quality of mirror via solar flux distribution measurement using a high speed optical scanner

K. K. Chong, T. K. Yew, C. W. Wong, and S. L. Lau  »View Author Affiliations


Applied Optics, Vol. 50, Issue 25, pp. 4927-4935 (2011)
http://dx.doi.org/10.1364/AO.50.004927


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Abstract

A method to study the solar flux distributions of the solar images reflected by mirrors with different dielectric thicknesses is proposed in this paper. An optical scanner, also known as a flux mapping system, capable of acquiring the flux distribution pattern of a light source in a two-dimensional flat surface, has been designed and constructed. The optical scanner can measure the profile of flux distribution at reasonably high resolution with fewer photo-sensors with a fast scanning speed of several seconds. The real time measurement results of solar images projected by mirrors with dielectric thicknesses, i.e., 3 mm , 4 mm , 5 mm and 6 mm , have been performed to analyze their surface qualities.

© 2011 Optical Society of America

OCIS Codes
(040.1240) Detectors : Arrays
(040.5160) Detectors : Photodetectors
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(120.5800) Instrumentation, measurement, and metrology : Scanners
(350.6050) Other areas of optics : Solar energy
(120.4880) Instrumentation, measurement, and metrology : Optomechanics

ToC Category:
Detectors

History
Original Manuscript: April 4, 2011
Revised Manuscript: July 18, 2011
Manuscript Accepted: July 20, 2011
Published: August 23, 2011

Citation
K. K. Chong, T. K. Yew, C. W. Wong, and S. L. Lau, "Study of image quality of mirror via solar flux distribution measurement using a high speed optical scanner," Appl. Opt. 50, 4927-4935 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-25-4927

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