A method to study the solar flux distributions of the solar images reflected by mirrors with different dielectric thicknesses is proposed in this paper. An optical scanner, also known as a flux mapping system, capable of acquiring the flux distribution pattern of a light source in a two-dimensional flat surface, has been designed and constructed. The optical scanner can measure the profile of flux distribution at reasonably high resolution with fewer photo-sensors with a fast scanning speed of several seconds. The real time measurement results of solar images projected by mirrors with dielectric thicknesses, i.e., $3\mathrm{mm}$ , $4\mathrm{mm}$ , $5\mathrm{mm}$ and $6\mathrm{mm}$ , have been performed to analyze their surface qualities.

© 2011 Optical Society of America

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