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Material classification of nanoparticles by focused beam scattering |
Applied Optics, Vol. 50, Issue 4, pp. 434-440 (2011)
http://dx.doi.org/10.1364/AO.50.000434
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Abstract
Advanced science and technology frequently encounters the need to detect particles in the micrometer and nanometer range of a given composition. While the scattering process of light by small particles is well documented, most conventional analytic methods employ wide illumination of large ensembles of particles. With such an approach, no information can be obtained about single particles due to their weak interaction. In this paper, we show that single particles can be classified with respect to their material composition by analyzing the scattering pattern of a focused Gaussian beam.
© 2011 Optical Society of America
OCIS Codes
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.4020) Scattering : Mie theory
(290.5850) Scattering : Scattering, particles
(260.6042) Physical optics : Singular optics
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: September 7, 2010
Revised Manuscript: November 22, 2010
Manuscript Accepted: December 13, 2010
Published: January 26, 2011
Virtual Issues
Vol. 6, Iss. 3 Virtual Journal for Biomedical Optics
Citation
Evyatar Hemo, Boris Spektor, and Joseph Shamir, "Material classification of nanoparticles by focused beam scattering," Appl. Opt. 50, 434-440 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-4-434
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