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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 4 — Feb. 1, 2011
  • pp: 434–440

Material classification of nanoparticles by focused beam scattering

Evyatar Hemo, Boris Spektor, and Joseph Shamir  »View Author Affiliations

Applied Optics, Vol. 50, Issue 4, pp. 434-440 (2011)

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Advanced science and technology frequently encounters the need to detect particles in the micrometer and nanometer range of a given composition. While the scattering process of light by small particles is well documented, most conventional analytic methods employ wide illumination of large ensembles of particles. With such an approach, no information can be obtained about single particles due to their weak interaction. In this paper, we show that single particles can be classified with respect to their material composition by analyzing the scattering pattern of a focused Gaussian beam.

© 2011 Optical Society of America

OCIS Codes
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.4020) Scattering : Mie theory
(290.5850) Scattering : Scattering, particles
(260.6042) Physical optics : Singular optics

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: September 7, 2010
Revised Manuscript: November 22, 2010
Manuscript Accepted: December 13, 2010
Published: January 26, 2011

Virtual Issues
Vol. 6, Iss. 3 Virtual Journal for Biomedical Optics

Evyatar Hemo, Boris Spektor, and Joseph Shamir, "Material classification of nanoparticles by focused beam scattering," Appl. Opt. 50, 434-440 (2011)

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