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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 13 — May. 1, 2012
  • pp: 2395–2399

Optical transmittance measurement system for coated elements with low transmittance

Hongyun Wang, Zhengshang Da, Lili Liu, and Juanning Zhao  »View Author Affiliations


Applied Optics, Vol. 51, Issue 13, pp. 2395-2399 (2012)
http://dx.doi.org/10.1364/AO.51.002395


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Abstract

The low-transmittance elements required for a high power laser facility have stringent specifications about transmittance. To validate optic performance against specifications, a metrology system for transmittance is proposed. The system is composed of a laser source, an integrating sphere, a power meter, and four uncoated wedged glasses. A relative measurement method is adopted, which is that the surface reflectivity of uncoated glass is used as the reference to compare with the sample’s transmittance. The systematic feature is that uncoated wedged glasses are applied to split and reflect beams, which not only avoid coating errors, but also make the two beam powers attenuate properly. Measurement results for a sample’s transmittance are presented. Experiment and analysis show that the relative standard uncertainty (σT/T) of measurement is 0.424%. This system is available for large-aperture elements.

© 2012 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.7000) Instrumentation, measurement, and metrology : Transmission

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 28, 2011
Revised Manuscript: February 16, 2012
Manuscript Accepted: March 1, 2012
Published: April 27, 2012

Citation
Hongyun Wang, Zhengshang Da, Lili Liu, and Juanning Zhao, "Optical transmittance measurement system for coated elements with low transmittance," Appl. Opt. 51, 2395-2399 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-13-2395


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References

  1. H. S. Peng, X. M. Zhang, and X. F. Wei, “Status of the SG-III solid state laser project,” Proc. SPIE 3492, 25–33 (1999). [CrossRef]
  2. X. Zhang, W. Zheng, and X. Wei, “Preliminary experimental results of shenguang III technical integration experiment line,” Proc. SPIE 5627, 6–12 (2005). [CrossRef]
  3. G. H. Miller, E. I. Moses, and C. R. Wuest, “The national ignition facility,” Opt. Eng. 43, 2841–2853 (2004). [CrossRef]
  4. Y. Zhang, X. Wen, Z. D. Xu, and D. Zhu, “The accuracy of a commercial spectrophotometer with single integrating sphere for measuring optical properties of turbid sample,” Proc. SPIE 7562, 1–9 (2010). [CrossRef]
  5. D. D. Sell, “A sensitive spectrophotometer for optical reflectance and transmittance measurements,” Appl. Opt. 9, 1926–1930 (1970).
  6. K. D. Mielenz, K. L. Eckerle, R. P. Madden, and J. Reader, “New reference spectrophotometer,” Appl. Opt. 12, 1630–1641 (1973). [CrossRef]
  7. H. S. Liu, D. D. Liu, Y. Q. Ji, and Z. S. Wang, “Optimizing operating parameters of spectrophotometer for testing transmission spectrum of optical substrate,” Proc. SPIE 7656, 765604 (2010). [CrossRef]
  8. J. Miao, P. Q. Yang, B. Q. Zhou, and J. Q. Zhu, “Two-beam reflectance and transmittance measurement for “Shengguang-II” facility,” Proc. SPIE 7656, 76564K(2010).
  9. J. Liu, H. F. Li, X. Liu, and P. F. Gu, “Spectrophotometer for measuring spectral transmittance and reflectance of large aperture optical element,” Proc. SPIE 5638, 229–236 (2005). [CrossRef]
  10. J. C. Zwinkels and D. S. Gignac, “Design and testing of a new high-accuracy ultraviolet-visible-near-infrared spectrophotometer,” Appl. Opt. 31, 1557–1567 (1992). [CrossRef]
  11. C. J. Stolz, M. Runkel, M. S. McBurney, R. Cheek, and J. A. Menapace, “Metrology of mirrors for the national ignition facility,” Proc. SPIE 5341, 114–120 (2004). [CrossRef]
  12. W. J. Smith, Modern Optical Engineering (McGraw-Hill, 2000), p. 174.
  13. W. J. Smith, Modern Optical Engineering (McGraw-Hill, 2000), p. 200.
  14. B. N. Taylor and C. E. Kuyatt, “Guidelines for evaluating and expressing the uncertainty of NIST measurement results,” NIST Technical Note 1297 (U.S. GPO, Washington, 1994).
  15. H. Ma and J. B. Wang, Error Theory and Apparatus Accuracy (The Publishing House of Defense Industry, Bei Jing, 2007), p. 40.
  16. G. A. Deng, Z. G. Cai, Y. H. Zhang, Y. K. Xu, S. Z. Wu, and J. Y. Zhou, “Refraction index measurement of transparent materials by using diffraction grating and CCD,” Acta Optica Sinica 24, 99–103 (2003).

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