|
Versatile light-emitting-diode-based spectral response measurement system for photovoltaic device characterization |
Applied Optics, Vol. 51, Issue 19, pp. 4469-4476 (2012)
http://dx.doi.org/10.1364/AO.51.004469
Enhanced HTML 
Acrobat PDF (737 KB)
Abstract
An absolute differential spectral response measurement system for solar cells is presented. The system couples an array of light emitting diodes with an optical waveguide to provide large area illumination. Two unique yet complementary measurement methods were developed and tested with the same measurement apparatus. Good agreement was observed between the two methods based on testing of a variety of solar cells. The first method is a lock-in technique that can be performed over a broad pulse frequency range. The second method is based on synchronous multifrequency optical excitation and electrical detection. An innovative scheme for providing light bias during each measurement method is discussed.
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(250.0250) Optoelectronics : Optoelectronics
ToC Category:
Detectors
History
Original Manuscript: May 4, 2012
Manuscript Accepted: May 24, 2012
Published: June 29, 2012
Citation
Behrang H. Hamadani, John Roller, Brian Dougherty, and Howard W. Yoon, "Versatile light-emitting-diode-based spectral response measurement system for photovoltaic device characterization," Appl. Opt. 51, 4469-4476 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-19-4469
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Interrogation unit for fiber Bragg grating sensors that uses a slanted fiber grating (OL)
- Study on eight-pass dual-frequency laser interferometer with nanometer precision (COL)
- Vibration compensating beam scanning interferometer for surface measurement (AO)
- Frequency spurious aversion by minimal reverse bias selection of a high-speed optically triggered sampling circuit based on a positive–intrinsic–negative photodiode (AO)
- Laser heterodyne interferometric signal processing method based on rising edge locking with high frequency clock signal (OE)
Related Conference Papers
- Semiconductor Optical Amplifier Bar Prober
- Measurement of Very Low Residual Reflections in Lensed-Fiber Pigtailed Semiconductor Optical Amplifier
- Experimental Demonstration of a Simple Time-of-Flight Rangefinder Based on a Semiconductor Optical Amplifier
- High-Speed Optical Characterization of Intensity and Phase Dynamics of a 1.55µm VCSEL for Short-Reach Applications
- Precise Calibration for Optical Amplifier Noise Figure Measurement Using the RIN Subtraction Method
« Previous Article | Next Article »
OSA is a member of 