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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 20 — Jul. 10, 2012
  • pp: 4563–4568

Spatial uniformity inspection apparatus for solar cells using a projection display

Jae-Keun Yoo, Seung Kwan Kim, Dong-Hoon Lee, and Seung-Nam Park  »View Author Affiliations


Applied Optics, Vol. 51, Issue 20, pp. 4563-4568 (2012)
http://dx.doi.org/10.1364/AO.51.004563


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Abstract

We demonstrate a measurement apparatus to inspect spatial uniformity of quantum efficiency of solar cells using a beam projector. Deviation of irradiance from the used beam projector over the area of 1.5×0.8m on the cell plane was flattened within ±2.6% through gray scale adjustment, which was originally about 200%. Scanning a small square image with an area of 3×3mm over a square-shaped photovoltaic cell with an area of 15.6×15.6cm, we could identify the locations according to efficiency level and showed that the cell had quantum efficiency deviation of more than 10%. Utilizing the advantageous feature of a projection display, we also demonstrated that this apparatus can inspect the spatial uniformity of solar modules and panels consisting of multiple solar cells.

© 2012 Optical Society of America

OCIS Codes
(040.5160) Detectors : Photodetectors
(040.5350) Detectors : Photovoltaic
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.5630) Instrumentation, measurement, and metrology : Radiometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 5, 2012
Revised Manuscript: May 17, 2012
Manuscript Accepted: May 22, 2012
Published: July 2, 2012

Citation
Jae-Keun Yoo, Seung Kwan Kim, Dong-Hoon Lee, and Seung-Nam Park, "Spatial uniformity inspection apparatus for solar cells using a projection display," Appl. Opt. 51, 4563-4568 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-20-4563

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